Zobrazeno 1 - 10
of 32
pro vyhledávání: '"Suresh Jayaraman"'
Publikováno v:
Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT). 2016:000751-000773
Fan-Out Wafer Level Packaging (FOWLP) holds immediate promise for packaging semiconductor chips with higher interconnect density than the incumbent Wafer Level Chip Scale Packaging (WLCSP). FOWLP enables size and performance capabilities similar to W
Autor:
InSu Mok, Curtis Zwenger, Moh Kolbehdari, IlBok Lee, Alex Copia, WonChul Do, Kang-Wook Lee, Wongeol Lee, Suresh Jayaraman, WonMyoung Ki
Publikováno v:
2018 IEEE 68th Electronic Components and Technology Conference (ECTC).
Fan-out wafer level packaging (FOWLP) is one of the latest technologies to meet the requirements of high performance and thin form-factor, especially for mobile application processors. To achieve a simple path way and thinner package form, many outso
Publikováno v:
Ace Analyser: Company News. 9/12/2023, pN.PAG-N.PAG. 1p.
Autor:
Rahul Goyal, Suresh Jayaraman, Sudipto Mukherjee, Anoop Chawla, Dhaval Jani, Nataraju Vusirikala
Publikováno v:
Traffic injury prevention. 13(6)
Human body finite element models (FE-HBMs) are available in standard occupant or pedestrian postures. There is a need to have FE-HBMs in the same posture as a crash victim or to be configured in varying postures. Developing FE models for all possible
Autor:
Jayaraman, Suresh1
Publikováno v:
Journal of Reproduction & Infertility. Oct-Dec2023, Vol. 24 Issue 4, p4-5. 2p.
Autor:
Rajaram, Rajendran1,2 (AUTHOR), Kiruba, Muniyandi3 (AUTHOR), Suresh, Chinnathambi2 (AUTHOR) csuresh@cecri.res.in, Mathiyarasu, Jayaraman1,2 (AUTHOR) almathi@cecri.res.in, Kumaran, Shanmugam4 (AUTHOR), Kumaresan, Ramanathan5 (AUTHOR)
Publikováno v:
Microchimica Acta. Jun2020, Vol. 187 Issue 6, p1-9. 9p.
Publikováno v:
Advancing Microelectronics; Jul/Aug2021, Vol. 48 Issue 4, p18-21, 4p
Publikováno v:
Advancing Microelectronics; 2024, Vol. 51 Issue 1, p18-35, 14p
Autor:
Jayaraman, Suresh
Publikováno v:
Advancing Microelectronics; 2023, Vol. 50 Issue 3, p4-4, 2/3p
Publikováno v:
Advancing Microelectronics; Jan/Feb2023, Vol. 50 Issue 1, p40-51, 11p