Zobrazeno 1 - 10
of 18
pro vyhledávání: '"Supriyo Srimani"'
Publikováno v:
Integration. 84:92-101
Publikováno v:
Lecture Notes in Electrical Engineering ISBN: 9789819900541
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::851fe2f7b23571f020ad36a8455c27ba
https://doi.org/10.1007/978-981-99-0055-8_33
https://doi.org/10.1007/978-981-99-0055-8_33
Publikováno v:
Lecture Notes in Electrical Engineering ISBN: 9789819900541
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::868ac24c2f0468e0ab123c48e8ee6c4e
https://doi.org/10.1007/978-981-99-0055-8_13
https://doi.org/10.1007/978-981-99-0055-8_13
Publikováno v:
IETE Journal of Research. :1-11
Oscillation-based test algorithm has been proposed and verified experimentally as an alternative to the specification--based test of analog circuits. Active filters are transformed to oscillators u...
Autor:
Supriyo Srimani, Hafizur Rahaman
Publikováno v:
2022 IEEE International Test Conference (ITC).
Publikováno v:
Circuits, Systems, and Signal Processing. 39:4281-4296
This paper presents a method for the detection of parametric faults in linear filters with the help of impulse response which is studied on the basis of cross-correlation, a statistical metric. Impulse input is generated with delay flip flops and R
Publikováno v:
VLSI Design
In this work, a cost-effective methodology has been proposed for estimating functional parameters of analog circuits to ensure faster production testing. The new test algorithm predicts the functional parameters of the circuit under test from the out
Publikováno v:
2020 IEEE International Test Conference India.
In this work, the diagnosis of hard and soft faults in analog circuits has been addressed using Wavelet Transform as a preprocessor and Support Vector Machine (SVM) as a classifier. Test circuits have been excited with random analog signal and the ou
Autor:
Kasturi Ghosh, Sumit Kumar Jaiswal, Subhajit Das, Hafizur Rahaman, Annapurna Mondal, Supriyo Srimani
Publikováno v:
ISDCS
A Dynamic Comparator is an important part of the analog-to-digital converter (ADC). The performance and accuracy of ADC depends on the design of comparator. Moreover, comparator is the most power-hungry among all other parts of ADC. To satisfy speed
Publikováno v:
iSES
Distortion of amplifiers caused by the non-linear behavior of circuit components, is measured with the help of Volterra Kernel analysis. In this work, Volterra kernels are extracted by mathematical model as well as from spectral density of Circuit un