Zobrazeno 1 - 10
of 19
pro vyhledávání: '"Supriya S. Kanyal"'
Publikováno v:
Surface Science Spectra. 22:29-33
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::473566cc585adcee88535bb5213e6f8c
https://doi.org/10.1116/1.4931984
https://doi.org/10.1116/1.4931984
Publikováno v:
Surface Science Spectra. 22:22-28
The authors report the positive and negative ion time-of-flight secondary ion mass spectrometry spectra obtained with Bi32+ primary ions at 50 keV of an Fe film annealed in hydrogen at 750 °C to form Fe nanoparticles. This surface had been exposed t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e895c616e7dce22baa9ee0513df70bb5
https://doi.org/10.1116/1.4931977
https://doi.org/10.1116/1.4931977
Publikováno v:
Surface Science Spectra. 22:14-21
The authors report the positive and negative ion time-of-flight secondary ion mass spectrometry spectra using Bi32+ primary ions at 50 keV of an Fe film (6 nm) that had been thermally evaporated on a thin film of alumina (ca. 35 nm) on a silicon wafe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a33916de66362d0a5d366b937a5bb8d2
https://doi.org/10.1116/1.4930929
https://doi.org/10.1116/1.4930929
Publikováno v:
Surface Science Spectra. 22:7-13
The authors report the positive and negative ion time-of-flight secondary ion mass spectrometry characterization of a thin film of e-beam evaporated alumina on a silicon substrate using Bi3 ++ primary ions at 50 keV, where this film prevents poisonin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6de7dd83520cda6a9e954e653e644ae0
https://doi.org/10.1116/1.4930928
https://doi.org/10.1116/1.4930928
Publikováno v:
Surface Science Spectra. 22:1-6
The authors report the time-of-flight secondary ion mass spectrometry of Si (100)/SiO2. Both positive and negative ion spectra were obtained using a cluster ion source (Bi3 2+ primary ions at 50 keV). Si+ is the base peak in positive ion mode. The ne
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::11803325acd8633409e84bf846885ef6
https://doi.org/10.1116/1.4930256
https://doi.org/10.1116/1.4930256
Publikováno v:
Surface and Interface Analysis. 47:340-344
Microfabricated silica thin layer chromatography (TLC) plates have previously been prepared on patterned carbon nanotube forests. The high temperatures used in their fabrication reduce the number of hydroxyl groups on their surfaces. Fortunately, sil
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cd7dddbbce18ed87645a1c7cc7af85cf
https://doi.org/10.1002/sia.5713
https://doi.org/10.1002/sia.5713
Autor:
Richard Vanfleet, Supriya S. Kanyal, David S. Jensen, Matthew R. Linford, Robert C. Davis, Andrew E. Dadson
Publikováno v:
Journal of Planar Chromatography – Modern TLC. 27:151-156
We describe the direct, conformal, atomic layer deposition (ALD) of silica onto carbon nanotubes (CNTs) in the microfabrication of thinlayer chromatography (TLC) plates. As before, these plates were prepared with zig-zag hedge and channel microstruct
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ee9a136c8c2995c236257f0ac66ba7f8
https://doi.org/10.1556/jpc.27.2014.3.1
https://doi.org/10.1556/jpc.27.2014.3.1
Autor:
Matthew R. Linford, Supriya S. Kanyal, Mark H. Engelhard, Nitesh Madaan, Andrew E. Dadson, David S. Jensen, Michael A. Vail
Publikováno v:
Surface Science Spectra. 20:36-42
Silicon (100) substrates are ubiquitous in microfabrication and, accordingly, their surface characteristics are important. Herein, we report the analysis of Si (100) via X-ray photoelectron spectroscopy (XPS) using monochromatic Al Kα radiation. Sur
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a281fb84502031807850f710b2fd8340
https://doi.org/10.1116/11.20121101
https://doi.org/10.1116/11.20121101
Autor:
Supriya S. Kanyal, Matthew R. Linford, Michael A. Vail, David S. Jensen, Mark H. Engelhard, Nitesh Madaan, Andrew E. Dadson, Hussein Samha
Publikováno v:
Surface Science Spectra. 20:43-48
We report the XPS characterization of a thin film of Al2O3 (35 nm) deposited via e-beam evaporation onto silicon (100). The film was characterized with monochromatic Al Kα radiation. An XPS survey scan, an Al 2p narrow scan, an O 1s narrow scan, and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1f20ce3dad0b50f3a7301eac100e3180
https://doi.org/10.1116/11.20121102
https://doi.org/10.1116/11.20121102
Autor:
David S. Jensen, Michael A. Vail, Supriya S. Kanyal, Nitesh Madaan, Andrew E. Dadson, Mark H. Engelhard, Matthew R. Linford
Publikováno v:
Surface Science Spectra. 20:49-54
We report the XPS characterization of a thermally evaporated iron thin film (6 nm) deposited on an Si/SiO2/Al2O3 substrate using Al Kα x-rays. An XPS survey spectrum, Fe 2p and O 1s narrow scans, and a valence band scan are shown.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::928b95df995e0756065d7e3ed674b6a6
https://doi.org/10.1116/11.20121104
https://doi.org/10.1116/11.20121104