Zobrazeno 1 - 10
of 12
pro vyhledávání: '"Sungyoon Ryu"'
Autor:
Sunhong Jun, Wonjun Choi, DongHoon Kim, Hayan Park, Dongmin Kyeon, Kyounghwan Lee, Yong-Ju Jeon, Chaemin Lee, Kwangchul Kim, Jeongsu Han, Sungyoon Ryu, Younghoon Sohn, Yongdeok Jeong
Publikováno v:
Metrology, Inspection, and Process Control XXXVII.
A study on defect signal improvement using multi-scan optic patch images and new detection algorithm
Publikováno v:
Metrology, Inspection, and Process Control XXXVII.
Autor:
DongHoon Kim, Sungyoon Ryu, Sunhong Jun, Heeyoon Han, Wonjun Choi, Yong-Ju Jeon, Hyun Lee, Souk Kim, Younghoon Sohn
Publikováno v:
Metrology, Inspection, and Process Control XXXVII.
Publikováno v:
Metrology, Inspection, and Process Control XXXVI.
Autor:
Sungyoon Ryu, Donghoon Kim, Sunhong Jun, Suho Ryu, JaeHyung Ahn, Hyun Lee, KwangEun Kim, Yusin Yang, Younghoon Sohn
Publikováno v:
Metrology, Inspection, and Process Control XXXVI.
Publikováno v:
Metrology, Inspection, and Process Control XXXVI.
Publikováno v:
Microscopy and Microanalysis. 28:800-801
Publikováno v:
Optical Measurement Systems for Industrial Inspection XII.
The era of big data and cloud computing services has driven the demand for higher capacity and more compact semiconductor devices. As a result, semiconductor devices are moving from 2-D to 3-D. Most notably, threedimensional (3D) NAND flash memory is
Publikováno v:
Microscopy and Microanalysis. 27:792-793
Autor:
Sendelbach, Matthew J., Schuch, Nivea G., Suzuki, Kenji, Murakami, Fumikazu, Baek, Inkeun, Numata, Mitsunori, Kim, Ingi, Sungyoon, Ryu, Ueyama, Shinji, Yang, Yusin, Tonouchi, Masayoshi
Publikováno v:
Proceedings of SPIE; April 2024, Vol. 12955 Issue: 1 p1295506-1295506-11