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pro vyhledávání: '"Sungil Jo"'
Autor:
Young-Gun Ko, Jeongmin Choi, Y. Yasuda-Masuoka, Kyunghoon Jung, Heebum Hong, Sungil Jo, Jae-Hun Jeong, Minseong Lee, Young-Ho Lee, Sihyung Lee, Ju Youn Kim, Gitae Jeong, Kihwang Son, Ho Lee, Byungha Choi, Hyung-Jong Lee, Chunghwan Shin, Jong Mil Youn, Sung Won Kim, Jae-Chul Kim
Publikováno v:
2020 IEEE International Electron Devices Meeting (IEDM).
In this paper, we demonstrate state of the art 5nm technology (5LPE) having co-optimization process for Dual CPP (Critical Poly-Pitch) technology to maximize Product Power-Performance-Area by separating both high speed and low power blocks. As a resu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e0efae1aa35f1f41261d412f146b43f5
https://doi.org/10.1109/iedm13553.2020.9371958
https://doi.org/10.1109/iedm13553.2020.9371958
