Výsledky vyhledávání - "Sungho Kang Kang"

Efficient Path Delay Test Generation for Custom Designs

Autor: Bill Underwood Underwood, Haluk Konuk, Wai-on Law, Sungho Kang Kang

Publikováno v: ETRI Journal. 23:138-150

Due to the rapidly growing complexity of VLSI circuits, test methodologies based on delay testing become popular. However, most approaches cannot handle custom logic blocks which are described by logic functions rather than by circuit primitive eleme

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::cf498ddbcfe7142d46f5f7a1a60cf9ba
https://doi.org/10.4218/etrij.01.0101.0306

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Dynamic Power Supply Current Testing for Open Defects in CMOS SRAMs

Autor: Sungho Kang Kang, Doe Hyun Yoon, Hong-Sik Kim

Publikováno v: ETRI Journal. 23:77-84

The detection of open defects in CMOS SRAM has been a time consuming process. This paper proposes a new dynamic power supply current testing method to detect open defects in CMOS SRAM cells. By monitoring a dynamic current pulse during a transition w

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::9c7fb97c124ce81df59486b4267ebf2c
https://doi.org/10.4218/etrij.01.0101.0205

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