Zobrazeno 1 - 10
of 483
pro vyhledávání: '"Sung-Min Yoon"'
Autor:
So-Yeong Na, Sung-Min Yoon
Publikováno v:
IEEE Journal of the Electron Devices Society, Vol 7, Pp 453-461 (2019)
We fabricated the charge-trap memory thin film transistors (CTM-TFTs) using InGaZnO (IGZO) active channel and HfO2/ZnO stack-structured charge-trap layer (CTL). To investigate the effects of the number and thickness of HfO2 layers inserted between th
Externí odkaz:
https://doaj.org/article/c33cf01aa1df44cfbddfab730a00fd34
Publikováno v:
Applied Sciences, Vol 11, Iss 12, p 5526 (2021)
In a hot rolling process, excessive friction between rollers and steel plates may lead to the formation of scratches on the steel plate. To reduce scratch formation in the finishing mill of the hot rolling process, two techniques are proposed in this
Externí odkaz:
https://doaj.org/article/939444b00f4445f0b9de25c3976c5254
Autor:
Solyee Im, Seung-Youl Kang, Yeriaron Kim, Jeong Hun Kim, Jong-Pil Im, Sung-Min Yoon, Seung Eon Moon, Jiyong Woo
Publikováno v:
Micromachines, Vol 11, Iss 10, p 910 (2020)
Since ferroelectricity has been observed in simple binary oxide material systems, it has attracted great interest in semiconductor research fields such as advanced logic transistors, non-volatile memories, and neuromorphic devices. The location in wh
Externí odkaz:
https://doaj.org/article/1f095b79cad947a4b333de91717183a0
Publikováno v:
Frontiers in Microbiomes, Vol 2 (2023)
IntroductionSeveral animal and clinical studies have reported that the state of the human gut microbiome is associated with hypertension. In this study, we investigated the association between the gut microbiome and hypertension in a Korean populatio
Externí odkaz:
https://doaj.org/article/e559c8f7510f4a23bad9ecc5e2ec1cdf
Autor:
Hyun-Min Ahn, Seo-Hyun Moon, Young-Ha Kwon, Nak-Jin Seong, Kyu-Jeong Choi, Chi-Sun Hwang, Jong-Heon Yang, Yong-Hae Kim, Sung-Min Yoon
Publikováno v:
IEEE Electron Device Letters. 43:1909-1912
Autor:
Shin-Ho Noh, Hyo-Eun Kim, Jong-Heon Yang, Yong-Hae Kim, Young-Ha Kwon, Nak-Jin Seong, Chi-Sun Hwang, Kyu-Jeong Choi, Sung-Min Yoon
Publikováno v:
IEEE Transactions on Electron Devices. 69:5542-5548
Autor:
Soo-Hyun Bae, Jong-Heon Yang, Yong-Hae Kim, Young Ha Kwon, Nak-Jin Seong, Kyu-Jeong Choi, Chi-Sun Hwang, Sung-Min Yoon
Publikováno v:
ACS Applied Materials & Interfaces. 14:31010-31023
Roles of oxygen interstitial defects located in the In-Ga-Zn-O (IGZO) thin films prepared by atomic layer deposition were investigated with controlling the cationic compositions and gate-stack process conditions. It was found from the spectroscopic e
Autor:
Seunghee Jin, Juye Jeon, Min Jung Kim, Kiseok Heo, Jeong Hun Kim, Jong-Pil Im, Sung-Min Yoon, Seung Eon Moon, Jiyong Woo, Jae Woo Lee
Publikováno v:
Applied Physics Letters. 122
Switching characteristics of ferroelectrics depend on the fabrication conditions and phase-transition results of each fabrication recipe. Here, the pulsed I–V and positive-up negative-down plots of hafnium zirconium oxide ferroelectric capacitors (
Publikováno v:
ACS Applied Electronic Materials. 4:2953-2963
Publikováno v:
Amorphous Oxide Semiconductors. :431-456