Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Sung-Chu Yu"'
Autor:
Chien-Hsueh Lin, Kao-Chi Lee, Ying-Yen Chen, Jih-Nung Lee, Mango C.-T. Chao, Sung-Chu Yu, Chih-Ying Tsai, Wen-Rong Liau, Alex Hou, Chun-Yi Kuo
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 37:2139-2151
To measure the variation of device $V_{t}$ requires long test for conventional wafer acceptance test (WAT) test structures. This paper presents a framework that can efficiently and effectively obtain the mean and variance of $V_{t}$ for a large numbe
Autor:
Jih-Nung Lee, Chien-Hsueh Lin, Mango C.-T. Chao, Sung-Chu Yu, Kao-Chi Lee, Chih-Ying Tsai, Ying-Yen Chen, Wen-Rong Liau, Alex Hou, Chun-Yi Kuo
Publikováno v:
VTS
To measure the variation of device Vt requires long test for conventional WAT test structures. This paper presents a framework that can efficiently and effectively obtain the mean and variance of Vt for a large number of DUTs. The proposed framework
Publikováno v:
IEEE Sensors Journal. 12:2129-2134
This paper presents a flexible inductive coil tag for sensing the electric current in the two-wire power cords of household goods. The tag is fabricated using a complementary metal-oxide semiconductor compatible SU-8 flexible technology which provide
Autor:
Sung Chu-Yu, 宋宁宇
96
In recent years the cable TV entrepreneur invested new technological development. Most the them already completed the head end generally to the distribution center network specification. However, below the distribution center, building necess
In recent years the cable TV entrepreneur invested new technological development. Most the them already completed the head end generally to the distribution center network specification. However, below the distribution center, building necess
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/65339111255001084828
Publikováno v:
IEEE Sensors Journal; Jun2012, Vol. 12 Issue 6, p2129-2134, 6p