Zobrazeno 1 - 10
of 89
pro vyhledávání: '"Sung Chul Ha"'
Publikováno v:
Scientific Reports, Vol 13, Iss 1, Pp 1-12 (2023)
Abstract The Maf polymorphic toxin system is involved in conflict between strains found in pathogenic Neisseria species such as Neisseria meningitidis and Neisseria gonorrhoeae. The genes encoding the Maf polymorphic toxin system are found in specifi
Externí odkaz:
https://doaj.org/article/9d791b976c9e42c686beb2606ec1296d
Autor:
Eunju Kwon, Deepak Pathak, Han-ul Kim, Pawan Dahal, Sung Chul Ha, Seung Sik Lee, Hyeongseop Jeong, Dooil Jeoung, Hyeun Wook Chang, Hyun Suk Jung, Dong Young Kim
Publikováno v:
IUCrJ, Vol 6, Iss 5, Pp 938-947 (2019)
The stressosome transduces environmental stress signals to SigB to upregulate SigB-dependent transcription, which is required for bacterial viability. The stressosome core is composed of RsbS and at least one of the RsbR paralogs. A previous cryo-ele
Externí odkaz:
https://doaj.org/article/c7258240a62445c49a7eeb092899dd99
Publikováno v:
Frontiers in Microbiology, Vol 10 (2019)
The currently known prokaryotic adaptive immune system against mobile genetic elements is based on clustered regularly interspaced short palindromic repeats (CRISPR). CRISPR-associated (Cas) proteins and the transcribed short CRISPR RNA (crRNA) molec
Externí odkaz:
https://doaj.org/article/9ddaee5f34ae46329a6e5c03137c2f8c
Autor:
Song-Yi Lee, Hakbong Lee, Hye-Kyeong Lee, Seung-Won Lee, Sung Chul Ha, Taejoon Kwon, Jeong Kon Seo, Changwook Lee, Hyun-Woo Rhee
Publikováno v:
ACS Central Science, Vol 2, Iss 8, Pp 506-516 (2016)
Externí odkaz:
https://doaj.org/article/b67dab9e4e414f7292a70814d405916a
Publikováno v:
PLoS ONE, Vol 12, Iss 3, p e0174284 (2017)
Bacillus subtilis SigW is localized to the cell membrane and is inactivated by the tight interaction with anti-sigma RsiW under normal growth conditions. Whereas SigW is discharged from RsiW binding and thus initiates the transcription of its regulon
Externí odkaz:
https://doaj.org/article/4cb653a803274bd48da9c0da60501094
Publikováno v:
Journal of Applied Reliability. 23:89-96
Autor:
Sung-Chul Ha
Publikováno v:
Journal of the Korea Academia-Industrial cooperation Society. 24:228-234
Autor:
Sung-Chul Ha, Seung-Jin Han
Publikováno v:
Journal of the Korea Academia-Industrial cooperation Society. 23:227-235
Autor:
Sung-Chul Ha, Young-In Jung, Jong-Chan Lee, Min-Young Kim, Si-Il Sung, Kyungsu Park, Jaehun Park
Publikováno v:
Journal of Applied Reliability. 22:263-271
Autor:
Sung-Chul Ha
Publikováno v:
Journal of the Korea Academia-Industrial cooperation Society. 23:225-231