Industrial Microelectronics towards the Year 2000 : — A Report on Objectives and Results of a Research Collaboration at the Center for Industrial Research and the University of Oslo

Autor: Ohlckers, P., Sundby Avset, B., Bjorneklett, A., Evensen, L., Gakkestad, J., Hanneborg, A., Hansen, T., Kjensmo, A., Kristiansen, E., Kristiansen, H., von der Lippe, H., Nese, M., Nygård, E., Serck‐Hanssen, F., Søråsen, O.

Publikováno v: Microelectronics International: An International Journal, 1993, Vol. 10, Issue 3, pp. 4-11.

Externí odkaz: http://www.emeraldinsight.com/doi/10.1108/eb044506

Developments for radiation hard silicon detectors by defect engineering—results by the CERN RD48 (ROSE) Collaboration

Autor: Lindström, G. ^*, Ahmed, M., Albergo, S., Allport, P., Anderson, D., Andricek, L., Angarano, M.M., Augelli, V., Bacchetta, N., Bartalini, P., Bates, R., Biggeri, U., Bilei, G.M., Bisello, D., Boemi, D., Borchi, E., Botila, T., Brodbeck, T.J., Bruzzi, M., Budzynski, T., Burger, P., Campabadal, F., Casse, G., Catacchini, E., Chilingarov, A., Ciampolini, P., Cindro, V., Costa, M.J., Creanza, D., Clauws, P., Da Via, C., Davies, G., De Boer, W., Dell’Orso, R., De Palma, M., Dezillie, B., Eremin, V., Evrard, O., Fallica, G., Fanourakis, G., Feick, H., Focardi, E., Fonseca, L., Fretwurst, E., Fuster, J., Gabathuler, K., Glaser, M., Grabiec, P., Grigoriev, E., Hall, G., Hanlon, M., Hauler, F., Heising, S., Holmes-Siedle, A., Horisberger, R., Hughes, G., Huhtinen, M., Ilyashenko, I., Ivanov, A., Jones, B.K., Jungermann, L., Kaminsky, A., Kohout, Z., Kramberger, G., Kuhnke, M., Kwan, S., Lemeilleur, F., Leroy, C., Letheren, M., Li, Z., Ligonzo, T., Linhart, V., Litovchenko, P., Loukas, D., Lozano, M., Luczynski, Z., Lutz, G., MacEvoy, B., Manolopoulos, S., Markou, A., Martinez, C., Messineo, A., Miku, M., Moll, M., Nossarzewska, E., Ottaviani, G., Oshea, V., Parrini, G., Passeri, D., Petre, D., Pickford, A., Pintilie, I., Pintilie, L., Pospisil, S., Potenza, R., Radicci, V., Raine, C., Rafi, J.M., Ratoff, P.N., Richter, R.H., Riedler, P., Roe, S., Roy, P., Ruzin, A., Ryazanov, A.I., Santocchia, A., Schiavulli, L., Sicho, P., Siotis, I., Sloan, T., Slysz, W., Smith, K., Solanky, M., Sopko, B., Stolze, K., Sundby Avset, B., Svensson, B., Tivarus, C., Tonelli, G., Tricomi, A., Tzamarias, S., Valvo, G., Vasilescu, A., Vayaki, A., Verbitskaya, E., Verdini, P., Vrba, V., Watts, S., Weber, E.R., Wegrzecki, M., Wegrzecka, I., Weilhammer, P., Wheadon, R., Wilburn, C., Wilhelm, I., Wunstorf, R., Wüstenfeld, J., Wyss, J., Zankel, K., Zabierowski, P., Zontar, D.

Publikováno v: In Nuclear Inst. and Methods in Physics Research, A 2001 465(1):60-69