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Autor:
Sunday Nereus Agbo, Erfan Bashar, Ruizhu Wu, Simon Mendy, Jose Ortiz Gonzalez, Olayiwola Alatise
Using experimental measurements and finite element simulations, this paper investigates the failure mode of SiC Cascode JFETs under short circuit (SC) conditions. Unlike SiC MOSFETs, where failure results in a shorted gate-source terminal (resulting
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a97b8a54470106a7ba85adf03a88d1d2
http://wrap.warwick.ac.uk/161786/1/WRAP-Simulations-measurements-failure-modes-SiC-cascodes-JFETs-conditions-2021.pdf
http://wrap.warwick.ac.uk/161786/1/WRAP-Simulations-measurements-failure-modes-SiC-cascodes-JFETs-conditions-2021.pdf