Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Sun, Ruo‐Yao"'
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Autor:
Zhu, Bing‐Xuan, Zhu, Cheng‐Yi, Qin, Jing‐Kai, He, Wen, Yue, Lin‐Qing, Huang, Pei‐Yu, Li, Dong, Sun, Ruo‐Yao, Ye, Sheng, Du, Yu, Sui, Jie‐He, Li, Ming‐Yu, Mao, Jun, Zhen, Liang, Xu, Cheng‐Yan
Publikováno v:
InfoMat; Oct2024, Vol. 6 Issue 10, p1-1, 1p
Autor:
Qin, Jing‐Kai, Zhu, Bing‐Xuan, Wang, Cong, Zhu, Cheng‐Yi, Sun, Ruo‐Yao, Zhen, Liang, Chai, Yang, Xu, Cheng‐Yan
Publikováno v:
Advanced Electronic Materials; Nov2022, Vol. 8 Issue 11, p1-9, 9p
Autor:
Qin, Jing‐Kai, Zhu, Bing‐Xuan, Wang, Cong, Zhu, Cheng‐Yi, Sun, Ruo‐Yao, Zhen, Liang, Chai, Yang, Xu, Cheng‐Yan
Publikováno v:
Advanced Electronic Materials; Nov2022, Vol. 8 Issue 11, p1-1, 1p
Autor:
Sun RY; School of Integrated Circuits, Harbin Institute of Technology (Shenzhen), Shenzhen, 518055, China.; Sauvage Laboratory for Smart Materials, School of Materials Science and Engineering, Harbin Institute of Technology (Shenzhen), Shenzhen, 518055, China., Hou ZY; School of Microelectronics, Southern University of Science and Technology, Shenzhen, 518055, China., Chen Q; Sauvage Laboratory for Smart Materials, School of Materials Science and Engineering, Harbin Institute of Technology (Shenzhen), Shenzhen, 518055, China., Zhu BX; School of Integrated Circuits, Harbin Institute of Technology (Shenzhen), Shenzhen, 518055, China.; Sauvage Laboratory for Smart Materials, School of Materials Science and Engineering, Harbin Institute of Technology (Shenzhen), Shenzhen, 518055, China., Zhu CY; School of Integrated Circuits, Harbin Institute of Technology (Shenzhen), Shenzhen, 518055, China.; Sauvage Laboratory for Smart Materials, School of Materials Science and Engineering, Harbin Institute of Technology (Shenzhen), Shenzhen, 518055, China., Huang PY; School of Integrated Circuits, Harbin Institute of Technology (Shenzhen), Shenzhen, 518055, China.; Sauvage Laboratory for Smart Materials, School of Materials Science and Engineering, Harbin Institute of Technology (Shenzhen), Shenzhen, 518055, China., Hu ZH; School of Integrated Circuits, Harbin Institute of Technology (Shenzhen), Shenzhen, 518055, China., Zhen L; Sauvage Laboratory for Smart Materials, School of Materials Science and Engineering, Harbin Institute of Technology (Shenzhen), Shenzhen, 518055, China.; MOE Key Laboratory of Micro-Systems and Micro-Structures Manufacturing, Harbin Institute of Technology, Harbin, 150080, China., Zhou FC; School of Microelectronics, Southern University of Science and Technology, Shenzhen, 518055, China., Xu CY; Sauvage Laboratory for Smart Materials, School of Materials Science and Engineering, Harbin Institute of Technology (Shenzhen), Shenzhen, 518055, China.; MOE Key Laboratory of Micro-Systems and Micro-Structures Manufacturing, Harbin Institute of Technology, Harbin, 150080, China., Qin JK; School of Integrated Circuits, Harbin Institute of Technology (Shenzhen), Shenzhen, 518055, China.
Publikováno v:
Advanced materials (Deerfield Beach, Fla.) [Adv Mater] 2024 Nov 20, pp. e2409017. Date of Electronic Publication: 2024 Nov 20.