Zobrazeno 1 - 10
of 28
pro vyhledávání: '"Sumalay, Roy"'
Publikováno v:
Journal of Physics: Condensed Matter. 35:345001
Investigations of single and bilayers of bismuth are one of the most thrusting areas of research in contemporary condensed matter physics and material sciences. This is because such ultrathin layers of bismuth host interesting exotic electronic prope
Autor:
Stefan Förster, Martin Trautmann, Sumalay Roy, K. Mohseni, Eva Maria Zollner, Holger L. Meyerheim, Wolf Widdra, Florian O. Schumann
Publikováno v:
Zeitschrift für Kristallographie - Crystalline Materials. 231:749-755
We have carried out a surface X-ray diffraction (SXRD) analysis of the approximant structure related to the recently discovered two-dimensional dodecagonal oxidic quasicrystal. The structure is characterized by the 32.4.3.4 Archimedean tiling, first
Publikováno v:
Physica Status Solidi RRL-Rapid Research Letters
Using surface X-ray diffraction we have studied the atomic structure of ultra-thin sliver films deposited in the one monolayer thickness-regime on the (0001) surface of the Topological Insulator Bi2Se3. Depending on the preparation of the substrate s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c1252584fb97e438d0830ce5257a951e
https://hdl.handle.net/21.11116/0000-0009-2EB6-721.11116/0000-0009-2EB8-5
https://hdl.handle.net/21.11116/0000-0009-2EB6-721.11116/0000-0009-2EB8-5
Autor:
Mikhail M. Otrokov, Germán R. Castro, Stuart S. P. Parkin, K. Mohseni, A. G. Ryabishchenkova, Holger L. Meyerheim, Oleg E. Tereshchenko, Sumalay Roy, Konstantin A. Kokh, Ziya S. Aliev, Juan Rubio-Zuazo, Himanshu Fulara, Eugene V. Chulkov, Mahammad B. Babanly, Arthur Ernst
Publikováno v:
Physical Review B. 95
Using surface x-ray diffraction and scanning tunneling microscopy in combination with first-principles calculations, we have studied the geometric and electronic structure of Cs-deposited ${\mathrm{Bi}}_{2}{\mathrm{Se}}_{3}$(0001) surface kept at roo
Publikováno v:
Applied Surface Science. 263:666-670
Interdiffusion occurring across the interfaces in a Si/Ni/Si layered system during deposition at room temperature was probed using x-ray reflectivity (XRR) and polarized neutron reflectivity (PNR). Exploiting the complementarity of these techniques,
Publikováno v:
Journal of Synchrotron Radiation. 20:137-144
In this work nanoclusters formed in a Pt/Ni/C multi-trilayer by the ion-irradiated method of synthesis are characterized. In particular, an attempt to understand the role of interfaces in the synthesis is made. With this objective, ion-irradiation-in
Autor:
Sumalay Roy, B. N. Dev
Publikováno v:
physica status solidi (a). 209:1511-1519
Energetic ion-beam-induced mixing between Co and Si has been studied in a Si (∼5 nm)/Co (∼10 nm) bilayer system deposited on a Si (111) substrate for various ion fluences, ranging from 3 × 1014 ions/cm2 to 1 × 1015 ions/cm2. The amount of ion i
Publikováno v:
Applied Surface Science. 258:3967-3974
Nanostructural modifications in a double-graded Pt/Ni/C multi-trilayer, due to irradiation by an energetic ion-beam, have been analyzed using X-ray reflectivity (XRR), X-ray standing wave (XSW) and cross-sectional transmission electron microscopy (X-
Autor:
Sumalay Roy, B. N. Dev
Publikováno v:
Applied Surface Science. 257:7566-7572
Generation of X-ray standing waves in a multi-trilayer system with a varying periodicity along its depth is described. Microstructures of a synthetic 15-period Pt/Ni/C multilayer, which has such a varying periodicity, are investigated using X-ray ref
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 269:856-860
Parallel stripes of nanostructures on an n-type Si substrate have been fabricated by implanting 30 keV Ga + ions from a focused ion beam (FIB) source at three different fluences: 1 × 10 15 , 2 × 10 15 and 5 × 10 15 ions/cm 2 . Two sets of implanta