Zobrazeno 1 - 10
of 101
pro vyhledávání: '"Sulzbach, T"'
Autor:
Koblischka, M.R., Kirsch, M., Pfeifer, R., Getlawi, S., Rigato, F., Fontcuberta, J., Sulzbach, T., Hartmann, U.
Publikováno v:
In Journal of Magnetism and Magnetic Materials 2010 322(9):1697-1699
Publikováno v:
In Superlattices and Microstructures 2008 44(4):699-704
Publikováno v:
In Journal of Magnetism and Magnetic Materials 2007 316(2):e666-e669
Autor:
Rangelow, I.W., Ivanov, Tzv., Ivanova, K., Volland, B.E., Grabiec, P., Sarov, Y., Persaud, A., Gotszalk, T., Zawierucha, P., Zielony, M., Dontzov, D., Schmidt, B., Zier, M., Nikolov, N., Kostic, I., Engl, W., Sulzbach, T., Mielczarski, J., Kolb, S., Latimier, Du P., Pedreau, R., Djakov, V., Huq, S.E., Edinger, K., Fortagne, O., Almansa, A., Blom, H.O.
Publikováno v:
In Microelectronic Engineering 2007 84(5):1260-1264
Publikováno v:
In Journal of Magnetism and Magnetic Materials 2004 272 Part 3:2138-2140
Publikováno v:
In Ultramicroscopy 2003 97(1):377-384
Publikováno v:
In Microelectronic Engineering 2003 67:534-541
Publikováno v:
In Thin Solid Films 2003 428(1):93-97
Autor:
Frank, A., Zöllner, J.-P., Sarov, Y., Ivanov, T., Klett, S., Gotszalk, T., Zielony, M., Zawierucha, P., Schmidt, B., Zier, M., Nikolov, N., Engl, W., Sulzbach, T., Langlotz, E., Dontsov, D., Schott, W., Rangelow, I. W.
Publikováno v:
EUROSENSORS XXII, 07.-10.09.2008, Dresden, Deutschland
In this paper a macro model of a cantilever for mixed domain simulation only with SPICE is presented. Based on lumped elements of equivalent circuits a model is developed, which realizes a coupled electro-thermal-mechanical simulation including cross
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______4577::12d814683af59bfbef136cf09a183bc6
https://www.hzdr.de/publications/Publ-12181-1
https://www.hzdr.de/publications/Publ-12181-1
Autor:
Gotszalk, T., Zawierucha, P., Woszczyna, M., Zielony, M., Ivanov, T., Ivanova, K., Volland, B. E., Sarov, Y., Persaud, A., Dontzov, D., Schmidt, B., Nikolov, N., Kostic, I., Engl, W., Sulzbach, T., Mielczarski, J., Kolb, S., Pedreau, R., Huq, S. E., Edinger, K., Fortagne, O., Blom, H. O., Rangelow, I. W.
Publikováno v:
34th Micro and Nano Engineering Conference MNE08, 15.-18.09.2008, Athens, Greece
Main industry requirement for applying scanning probe microscopy in surface measurements is the high scan speed, which allow the microelectronics producers to obtain the information about the technological process quality in-situ on the semiconductor
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______4577::3922a5051aaefd56c82b9b69783630bf
https://www.hzdr.de/publications/Publ-12183-1
https://www.hzdr.de/publications/Publ-12183-1