Zobrazeno 1 - 10
of 13
pro vyhledávání: '"Suku Kim"'
Publikováno v:
IEEE Sensors Journal. 5:677-680
The characteristics of Pt/GaN Schottky diodes and Sc/sub 2/O/sub 3//AlGaN/GaN metal-oxide semiconductor (MOS) diodes as hydrogen and ethylene gas sensors and of gateless AlGaN/GaN high-electron mobility transistors (HEMTs) as polar liquid sensors are
Autor:
B. S. Kang, Suku Kim, S N G Chu, Stephen J. Pearton, C. R. Abernathy, Fan Ren, Brent P. Gila, Jenshan Lin
Publikováno v:
Journal of Physics: Condensed Matter. 16:R961-R994
There is renewed emphasis on development of robust solid-state sensors capable of uncooled operation in harsh environments. The sensors should be capable of detecting chemical, gas, biological or radiation releases as well as sending signals to centr
Publikováno v:
Scopus-Elsevier
Through-wafer vias were formed in 400-µm-thick bulk 4H-SiC substrates by CO2 laser drilling (1.06-µm λ) with a o-switched pulse width of ∼30 nsec and a pulse frequency of 8 Hz. The resultant pulse energy delivered to the SiC surface was on the o
Autor:
R. Mehandru, Stephen J. Pearton, Soon-oh Park, James Robert Lothian, Yong Jo Park, Fan Ren, Suku Kim, Jihyun Kim
Publikováno v:
Solid-State Electronics. 47:1037-1043
A finite element simulation was used to quantitatively estimate the effectiveness of flip-chip bonding in the temperature rise of bulk GaN Schottky rectifiers under various conditions of current density, duty cycle, forward turn-on voltage and on-sta
Autor:
W. Chang, G. T. Dang, W. S. Hobson, Hongen Shen, Fan Ren, Stephen J. Pearton, R. Mehandru, John Lopata, Suku Kim
Publikováno v:
Solid-State Electronics. 46:699-704
The finite difference method was used to analyze the thermal characteristics of continuous wave 850 nm AlGaAs/GaAs implant-apertured vertical-cavity surface-emitting lasers (VCSELs). A novel flip-chip design was used to enhance the heat dissipation.
Autor:
Kelly P. Ip, B. S. Kang, David P. Norton, Stephen J. Pearton, Young-Woo Heo, Fan Ren, Suku Kim
Publikováno v:
Applied Physics Letters. 84:1698-1700
Pt/ZnO Schottky diodes show changes in forward current of 0.3 mA at a forward bias of 0.5 V or alternatively a change of 50 mV bias at a fixed forward current of 8 mA when 5 ppm of H2 is introduced into a N2 ambient at 25 °C. The rectifying current
Autor:
Toshikazu Nishida, Fan Ren, S. N. G. Chu, K.H. Baik, V. Chandrasekaran, Stephen J. Pearton, Jihyun Kim, Brent P. Gila, Mark Sheplak, J.-I. Chyi, C. R. Abernathy, B. S. Kang, Chang Chi Pan, G.-T. Chen, Suku Kim
Publikováno v:
Applied Physics Letters. 83:4845-4847
The changes in the conductance of the channel of Al0.3Ga0.7N/GaN high-electron-mobility transistor structures during the application of both tensile and compressive strain were measured. For a fixed Al mole fraction, the changes in the conductance we
Autor:
Fan Ren, William S. Hobson, R. Mehandru, W. Chang, Stephen J. Pearton, Gerard Dang, John Lopata, Hongen Shen, Kelly P. Ip, Suku Kim
Publikováno v:
SPIE Proceedings.
Finite difference analysis was used to determine the thermal characteristics of continuous wave (CW) 850 nm AlGaAs/GaAs implant-apertured vertical-cavity surface-emitting lasers. A novel flip-chip design was used to enhance the heat dissipation. The
Autor:
Brent P. Gila, Young-Woo Heo, Fan Ren, B. S. Kang, C. R. Abernathy, Kelly P. Ip, Suku Kim, David P. Norton, Stephen J. Pearton
Publikováno v:
Journal of The Electrochemical Society. 151:G468
The characteristics of SC 2 O 3 /AIGaN/GaN metal-oxide semiconductor (MOS) diodes and Pt/ZnO Schottky diodes as detectors of C 2 H 4 are reported. At 25°C, a change in forward current of ∼40 μA at a bias of 2.5 V was obtained in response to a cha
Autor:
Jihyun Kim, Fan Ren, B. S. Kang, Suku Kim, G. Y. Chung, K.H. Baik, Stephen J. Pearton, Y. Irokawa
Publikováno v:
Electrochemical and Solid-State Letters. 7:G125
An array (305 devices) of 500 X 500 μm 4H-SiC Schottky rectifiers was interconnected using electroplated Au and clamped in a Cu pressure contact flat package. A peak total forward current of 430 A at 5.7V was achieved, with an on-state resistance (R