Zobrazeno 1 - 10
of 159
pro vyhledávání: '"Sujata Sanghi"'
Autor:
Jogender Singh, Ashish Agarwal, Sujata Sanghi, Pulkit Prakash, A. Das, C. L. Prajapat, Manisha Rangi
Publikováno v:
AIP Advances, Vol 9, Iss 2, Pp 025110-025110-14 (2019)
The changes in crystal and magnetic structure of BiFeO3 produced by partial substitution of Bi ions by Ho ions has been studied with powder X-ray diffraction, neutron powder diffraction, dielectric and magnetization techniques. The present study demo
Externí odkaz:
https://doaj.org/article/d7833e7d0458465b82a9a3e8eb918574
Publikováno v:
AIP Advances, Vol 4, Iss 8, Pp 087121-087121-11 (2014)
Bi0.8A0.2FeO3 (A = La, Ca, Sr, Ba) multiferroics were studied using x-ray, neutron diffraction and magnetization techniques. All the samples crystallized in rhombohedral structure with space group R3c. The compounds exhibit antiferromagnetic (AFM) or
Externí odkaz:
https://doaj.org/article/6ecc31295bf94ae8923d6b989e4bbaa7
Autor:
Ekta Arya, Ashish Agarwal, Rakesh Dhar, Sujata Sanghi, Meenal Chauhan, Vibha Vermani, Pooja Sharma, Shalu Kaushik
Publikováno v:
Materials Today: Proceedings. 82:145-150
Crystal structure, dielectric and magnetic properties of BaTiO3 –CoFe2O4 magneto-electric composites
Autor:
Meenal Chauhan, Ashish Agarwal, Sujata Sanghi, Ekta Arya, Vibha Vermani, Amit Jangra, Shalu Kaushik, null Gobinda
Publikováno v:
Materials Today: Proceedings. 82:186-191
Autor:
null Vibha, Sujata Sanghi, Ashish Agarwal, Meenal Chauhan, Ekta Arya, Anand Kumari, Shalu Kaushik, Pooja Sharma
Publikováno v:
Materials Today: Proceedings. 82:79-84
Publikováno v:
Journal of Materials Science: Materials in Electronics. 33:24631-24645
Publikováno v:
Journal of Materials Science: Materials in Electronics. 34
Autor:
Anand Kumari, Ompal Singh, Ekta Arya, Meenal Chauhan, Vibha Vermani, Sujata Sanghi, Ashish Agarwal
Publikováno v:
Applied Physics A. 129
Study of linear and non-linear optical properties of In–Se doped chalcogenide semiconducting glasses
Publikováno v:
Journal of Materials Science: Materials in Electronics. 33:12062-12074
Publikováno v:
Materials Today: Proceedings. 54:656-659