Zobrazeno 1 - 1
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pro vyhledávání: '"Sui-Yan Shang"'
Publikováno v:
IEEE Robotics and Automation Letters. 6:5720-5727
To ensure stable manufacturing and high yield of production, factories (e.g., semiconductor or TFT-LCD fabs) conduct quality inspection on workpieces. They tend to adopt sampling inspection in consideration of reducing cost and cycle time, yet that f
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2803af56aa26da54c8e671dbdc1dd276
https://doi.org/10.1109/lra.2021.3084882
https://doi.org/10.1109/lra.2021.3084882
