Zobrazeno 1 - 10
of 112
pro vyhledávání: '"Suhk Kun Oh"'
Publikováno v:
International Journal of Technology, Vol 7, Iss 3, Pp 493-499 (2016)
Modern technology for refrigerators and coolers is based on the chemical gas Chlorofluorocarbon (CFC) compression method that is indicative of a high consumption of electricity. The CFC is also understood as a reason for global warming. One of the
Externí odkaz:
https://doaj.org/article/d2a84711b4a6461db550c3e0bb2a15e6
Autor:
Suhk Kun Oh, The-Long Phan, Tran Dang Thanh, Seong Cho Yu, Pham Duc Huyen Yen, Duong Anh Tuan, Ying-Qiao Zhang, Dinh Chi Linh
Publikováno v:
Journal of Magnetism and Magnetic Materials. 470:59-63
In this work, a polycrystalline sample of La0.7Ca0.3Mn0.9Co0.1O3 was prepared by solid-state reaction method. The room-temperature X-ray diffraction analysis using Rietveld refinement technique confirms that the sample has a single-phase state with t
Autor:
Suhk Kun Oh, Sergey Demyanov, Nikolay Kalanda, Alexander Petrov, Seong-Cho Yu, Marta Yarmolich, Dong-Hyun Kim
Publikováno v:
Current Applied Physics. 18:27-33
Single-phase agglomerated Sr2FeMoO6-δ powders with the iron and molybdenum cations superstructural ordering of 88% were synthesized by sol-gel technique from the Sr(NO3)2 and Fe(NO3)3·9H2O solutions with pH = 4. The ultrasound dispersion enabled us
Publikováno v:
Tahir, D, Oh, S K, Kang, H J & Tougaard, S M 2016, ' Composition dependence of dielectric and optical properties of Hf-Zr-silicate thin films grown on Si(100) by atomic layer deposition ', Thin Solid Films, vol. 616, pp. 425-430 . https://doi.org/10.1016/j.tsf.2016.09.001
Composition dependence of the dielectric and optical properties of (HfZrO 4 ) (1 − x ) (SiO 2 ) ( x ) (0 ≤ x ≤ 0.2) gate dielectric thin films, grown on Si(100) by the atomic layer deposition method, was investigated by means of reflection elec
Autor:
JaeGwan Chung, Dong-Seok Yang, Sung Heo, Suhk Kun Oh, Hee Jae Kang, Teguh Firmansyah, Jae Cheol Lee, Yus Rama Denny
Publikováno v:
Materials Research Bulletin. 82:1-6
The dependence of electronic properties and local structure of tantalum oxide thin film on oxygen deficiency have been investigated by means of X-ray photoelectron spectroscopy (XPS), Reflection Electron Energy Loss Spectroscopy (REELS), and X-ray ab
Autor:
Suhk Kun OH
Publikováno v:
New Physics: Sae Mulli. 66:616-620
Autor:
Suhk Kun OH
Publikováno v:
New Physics: Sae Mulli. 66:621-630
Autor:
Nikolay Kalanda, Dmitry V. Karpinsky, Alexander Petrov, Marta Yarmolich, Dong-Hyun Kim, Sergey Demyanov, Suhk Kun Oh, Seong-Cho Yu
Publikováno v:
Journal of Electronic Materials. 45:3466-3472
Investigations of the formation conditions of Sr2FeMoO6−δ compound films, depending on the substrate temperature and sputtering rate with their subsequent thermal treatment, have made it possible to obtain the single-phase homogeneous films. The a
Autor:
Hee Jae Kang, Kangil Lee, Soonjoo Seo, Yus Rama Denny, Suhk Kun Oh, Dong-Seok Yang, Chanae Park
Publikováno v:
Thin Solid Films. 591:255-260
The electrical and optical properties as well as the electronic structure of sodium-doped (Na-doped) nickel oxide (NiO) thin films were investigated using X-ray photoelectron spectroscopy (XPS), reflection electron energy loss spectroscopy (REELS), X
Autor:
L. V. Kovalev, Marta Yarmolich, Alexander Petrov, Dong Hyun Kim, Nikolay Kalanda, Dwi Nanto, Seong Cho Yu, Suhk Kun Oh, Djati Handoko, Thanh Tran Dang, Sergey Demyanov
Publikováno v:
Solid State Phenomena. :364-367
We have investigated temperature-dependent magnetic hysteresis loop behavior of Ba2-xLaxFeMoO6 with double perovskite structure by means of a vibrating sample magnetometer (VSM). As partial substitution of Ba2+ by La3+ is varied from x = 0.1 to 0.3,