Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Sueng Min Lee"'
Publikováno v:
Cell Death Discovery, Vol 8, Iss 1, Pp 1-13 (2022)
Abstract Age-related bone loss and disease strongly affect the quality of life of the elderly population. Cellular circadian rhythms have been reported to regulate bone aging, and micro RNAs (miRNAs) play crucial posttranscriptional regulatory roles
Externí odkaz:
https://doaj.org/article/698a736a6d76467296b2d3072d485b4b
Publikováno v:
Clinical Oral Investigations. 25:1363-1374
To investigate the correlation between gingival phenotype and craniofacial profile and to evaluate the morphology of periodontal supporting tissues in the maxillary and mandibular anterior zones. A total of 66 patients with 264 central incisors in go
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5da8675602aa33b971b8e0f23b665693
https://doi.org/10.1007/s00784-020-03444-9
https://doi.org/10.1007/s00784-020-03444-9
Publikováno v:
Cell death discovery. 8(1)
Age-related bone loss and disease strongly affect the quality of life of the elderly population. Cellular circadian rhythms have been reported to regulate bone aging, and micro RNAs (miRNAs) play crucial posttranscriptional regulatory roles in the pe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::db14652b0ad1c5e6b8f674b276f87a3c
https://pubmed.ncbi.nlm.nih.gov/35279674
https://pubmed.ncbi.nlm.nih.gov/35279674
Publikováno v:
International Journal of Molecular Sciences
Volume 22
Issue 19
International Journal of Molecular Sciences, Vol 22, Iss 10632, p 10632 (2021)
Volume 22
Issue 19
International Journal of Molecular Sciences, Vol 22, Iss 10632, p 10632 (2021)
Aging has been proven to be one of the major causes of temporomandibular joint (TMJ) disability and pain in older people. Peripheral circadian rhythms play a crucial role in endochondral ossification and chondrogenesis. However, the age-related alter
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5dee4c6c4a7fd11807777c7d07a9c654
https://doi.org/10.3390/ijms221910632
https://doi.org/10.3390/ijms221910632
Publikováno v:
Solid-State Electronics. 72:88-92
The experimental investigations of hot carrier induced device degradation in IGZO thin film transistors under light illumination at elevated temperature have been performed. The degradations of threshold voltage and inverse subthreshold slope have be
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e475df78eb877a86e2a5cd37ea362eb1
https://doi.org/10.1016/j.sse.2012.02.010
https://doi.org/10.1016/j.sse.2012.02.010
Publikováno v:
Microelectronics Reliability. 51:1544-1546
The experimental investigations on the concurrent PBTI and CHC degradation in n-channel MuGFETs have been performed with different stress gate voltages, gate lengths, fin widths, and side surface orientations of fin body. The observed results suggest
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::81bf2276af06f6dcfab446cca7de1913
https://doi.org/10.1016/j.microrel.2011.06.006
https://doi.org/10.1016/j.microrel.2011.06.006