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pro vyhledávání: '"Sudarsan Acharya"'
Autor:
Michael Krumm, Randolf Hanke, Sudarsan Acharya, Frank Sukowski, Christoph Funk, Norman Uhlmann, Stefan Kasperl, Rolf Behrendt, Andreas Hamacher, Raimund Volk, Robert Schmitt, Alexander Warrikhoff, Ernst Neumann, Jochen Hiller, Björn Damm
Publikováno v:
SPIE Proceedings.
When integrating optic measurement systems into or next to the production line for part inspection and control of the production process requirements for m easurement devices like the measurement time and the measurement uncertainty have to be expand