Zobrazeno 1 - 10
of 20
pro vyhledávání: '"Subhasis Bhattacharjee"'
Autor:
Krishna Pada Sahoo, Arindam Roy, Mehedi Hasan Mandal, Benojir Yasmin, Subhasis Bhattacharjee, Giyasuddin Siddique
Publikováno v:
GeoJournal. 88:1493-1513
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5660d6877c33675c6ce8a76be3375fd7
https://doi.org/10.1007/s10708-022-10696-3
https://doi.org/10.1007/s10708-022-10696-3
Publikováno v:
Lecture Notes in Computer Science ISBN: 9783030948757
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::822f9665b8c2fa6a087538c471a4ac5f
https://doi.org/10.1007/978-3-030-94876-4_5
https://doi.org/10.1007/978-3-030-94876-4_5
Instantaneous Mean-Time-To-Failure (MTTF) estimation for checkpoint interval computation at run time
Publikováno v:
Microelectronics Reliability. 98:69-77
The Mean-Time-To-Failure (MTTF) is an important parameter that determines the life-time reliability of a system. It is being used in several fault-tolerant mechanisms to take a critical decision on processor/system state. Recently it has been found t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::958fca06eeb3582079e390e452d8fda1
https://doi.org/10.1016/j.microrel.2019.04.009
https://doi.org/10.1016/j.microrel.2019.04.009
Publikováno v:
COMSNETS
For large scale networks, under various formulations, the community detection problem is known to be NP-hard. Several genetic algorithm based community detection methods have been reported in the literature so far. But most of them exhibit a very slo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1e9d9fd9a9778fd72de856ee950d356f
https://doi.org/10.1109/comsnets.2019.8711127
https://doi.org/10.1109/comsnets.2019.8711127
Publikováno v:
Journal of Low Power Electronics. 10:401-416
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f9de37fdc5629b8fd07cf54a33c627f7
https://doi.org/10.1166/jolpe.2014.1343
https://doi.org/10.1166/jolpe.2014.1343
Autor:
Arijit Bishnu, Susmita Sur-Kolay, P. Banerjee, Subhas C. Nandy, Sandip Das, Subhasis Bhattacharjee
Publikováno v:
ACM Transactions on Embedded Computing Systems. 9:1-23
Research in VLSI placement, an NP-hard problem, has branched in two different directions. The first one employs iterative heuristics with many tunable parameters to produce a near-optimal solution but without theoretical guarantee on its quality. The
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e6d0e590730690c52a17510678ab57ec
https://doi.org/10.1145/1596543.1596546
https://doi.org/10.1145/1596543.1596546
Publikováno v:
Information Processing Letters. 109:478-484
In the point site labeling problem, we are given a set P={p"1,p"2,...,p"n} of point sites in the plane. The label of a point p"i is an axis-parallel rectangle of specified size. The objective is to label the maximum number of points on the map so tha
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::72907b7718717ce45b8b3190e584d628
https://doi.org/10.1016/j.ipl.2009.01.011
https://doi.org/10.1016/j.ipl.2009.01.011
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 23:637-651
To date, all of the proposals for low-power designs of RAMs essentially focus on circuit-level solutions. What we propose here is a novel architecture (high) level solution. Our methodology provides a systematic tradeoff between power and area. Also,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::86117409175bcf92e06e8acc960cd2b2
https://doi.org/10.1109/tcad.2004.826581
https://doi.org/10.1109/tcad.2004.826581
Autor:
Jimson Mathew, Rishad Shafik, Dhiraj K. Pradhan, Subhasis Bhattacharjee, Mohamad Imran bin Bandan
Publikováno v:
ISED
Check pointing mechanism is used to tolerate the impact of transient faults through roll-back operation to a previously saved system state. In this paper, we propose a novel check pointing mechanism that considers fault tolerance in a duplex system i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::12f56d7916d7f0376cd963eddf2870aa
https://doi.org/10.1109/ised.2013.32
https://doi.org/10.1109/ised.2013.32
Publikováno v:
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4fcf38a02bacff2bc43ae2273247889b
https://doi.org/10.7873/date.2013.229
https://doi.org/10.7873/date.2013.229