Zobrazeno 1 - 10
of 18
pro vyhledávání: '"Su Chang Jeon"'
Autor:
Dongku Kang, Minsu Kim, Su Chang Jeon, Wontaeck Jung, Jooyong Park, Gyosoo Choo, Dong-kyo Shim, Anil Kavala, Seung-Bum Kim, Kyung-Min Kang, Jiyoung Lee, Kuihan Ko, Hyun-Wook Park, Byung-Jun Min, Changyeon Yu, Sewon Yun, Nahyun Kim, Yeonwook Jung, Sungwhan Seo, Sunghoon Kim, Moo Kyung Lee, Joo-Yong Park, James C. Kim, Young San Cha, Kwangwon Kim, Youngmin Jo, Hyunjin Kim, Youngdon Choi, Jindo Byun, Ji-hyun Park, Kiwon Kim, Tae-Hong Kwon, Youngsun Min, Chiweon Yoon, Youngcho Kim, Dong-Hun Kwak, Eungsuk Lee, Wook-ghee Hahn, Ki-sung Kim, Kyungmin Kim, Euisang Yoon, Won-Tae Kim, Inryoul Lee, Seung hyun Moon, Jeongdon Ihm, Dae Seok Byeon, Ki-Whan Song, Sangjoon Hwang, Kye Hyun Kyung
Publikováno v:
ISSCC
Data storage is one of the hottest discussion topics in today’s connected world. The amount of data growth is expected to be exponential, while budget and space remain constricted. Since the transformation of storage device from planar NAND to 3D V
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6b04c30039dcb4cf878ce6ca3d1d7c71
https://doi.org/10.1109/isscc.2019.8662493
https://doi.org/10.1109/isscc.2019.8662493
Autor:
Dae-Seok Byeon, Kyung-Hwa Kang, Yongsu Choi, Jeon Hongsoo, Hyung-Gon Kim, Minseok Kim, Jeong-Don Ihm, Seon-Kyoo Lee, Kye-Hyun Kyung, Sungwhan Seo, Sung-Min Joe, Jin-Yub Lee, Su-Chang Jeon, Kitae Park, Byung-Hoon Jeong, HyunWook Park, Moosung Kim, Kim Su-Yong, Sung-Won Yun, Sangbum Yun, Young-Min Kim, Park Jiyoon, Hyang-ja Yang, Jong-Hoon Lee, Yong-Sik Yim, Sungkyu Jo, Byung-Kyu Cho, Hyejin Yim, Makoto Hirano, Jonghoon Park, Tae-eun Kim, Deok-kyun Woo, Lee Kang-Bin, Chan-Ho Kim, Hoosung Kim, Jongyeol Park, Jung-no Im, Yang-Lo Ahn, Seung-jae Lee, Jeong-Hyuk Choi, Park Il-Han, Minsu Kim, Jin-Tae Kim, Dooho Cho, Ho-Kil Lee
Publikováno v:
ISSCC
NAND flash memory is widely used as a cost-effective storage with high performance [1–2]. This paper presents a 128Gb multi-level cell (MLC) NAND flash memory with a 150 cells/string structure in 14nm CMOS that can be used as a cost-effective stora
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7b2055eff5e06a7382aaf3e142458866
https://doi.org/10.1109/isscc.2016.7417945
https://doi.org/10.1109/isscc.2016.7417945
Publikováno v:
Microelectronics Reliability. 49:42-50
In this paper, the long-term reliability of all monolithic 1.55-μm etched-mesa vertical cavity surface emitting lasers (VCSELs) with tunnel junction is investigated via high-temperature storage tests and accelerated life tests. Characteristic variat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::409679b0794d83ea08c2ba84677c0048
https://doi.org/10.1016/j.microrel.2008.10.008
https://doi.org/10.1016/j.microrel.2008.10.008
Autor:
Jin-Yub Lee, Yong Hoon Kang, Dae-Yong Kim, Sang-Hoon Lee, Jong Yeol Park, Pyungmoon Jang, Yun Ho Choi, Minseok Kim, Jong Nam Baek, Jun-Yong Park, Chan-Ho Kim, Joon Young Kwak, Sang Won Hwang, You-Sang Lee, Su Chang Jeon, Yong-Taek Jeong, Jin-Kook Kim
Publikováno v:
IEEE Journal of Solid-State Circuits. 43:507-517
High-voltage analog circuits, including a novel high-voltage regulation scheme, are presented with emphasis on low supply voltage, low power consumption, low area overhead, and low noise, which are key design metrics for implementing NAND Flash memor
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cd2113158687d1453742a6ef273d96a9
https://doi.org/10.1109/jssc.2007.914327
https://doi.org/10.1109/jssc.2007.914327
Publikováno v:
Solid-State Electronics. 50:1546-1550
The post-annealing effect on the dark current of the InGaAs waveguide photodiodes, which are developed for 40-Gbps optical receiver applications, is experimentally investigated. The interesting experimental phenomena were observed that the dark curre
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cf490952d557fac48f0bbec662f0c289
https://doi.org/10.1016/j.sse.2006.07.019
https://doi.org/10.1016/j.sse.2006.07.019
Publikováno v:
IEEE Transactions on Advanced Packaging. 29:488-495
In this paper, the circuit models of a waveguide photodiode (WGPD) and its submodule were investigated, and the O/E characteristics of a WGPD submodule are examined. Test structures of the WGPD and WGPD submodule were fabricated and microwave return
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8bcbf749aa12c107829dd2fb71b9daf7
https://doi.org/10.1109/tadvp.2006.875405
https://doi.org/10.1109/tadvp.2006.875405
Autor:
Ilgu Yun, Su Chang Jeon, Bongyong Lee, Yong-Hwan Kwon, Hongil Yoon, Han Sung Joo, Joong-Seon Choe
Publikováno v:
IEEE Transactions on Device and Materials Reliability. 5:262-267
The reliability of 1.55-/spl mu/m wavelength InGaAs waveguide photodiodes (WGPDs) fabricated by metal-organic chemical vapor deposition is investigated for 40-Gb/s optical receiver applications. Reliability for both high-temperature storage and accel
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::04f30c7775f9ae713cd194aed1be7959
https://doi.org/10.1109/tdmr.2005.846980
https://doi.org/10.1109/tdmr.2005.846980
Publikováno v:
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.
In this paper, the long-term reliability of all monolithic 1.55-μm vertical cavity surface emitting lasers (VCSELs) is investigated. High-temperature storage tests and accelerated life tests are used to evaluate long-term VCSEL reliability. Variatio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::be789b13ce3913ae95fd79a0726ec436
https://doi.org/10.1109/relphy.2007.369937
https://doi.org/10.1109/relphy.2007.369937
Publikováno v:
International Meeting for Future of Electron Devices, 2004..
As a summary, the reliability testing of mesa InGaAs WGPDs from the viewpoint of evaluation long-term reliability has been investigated using the accelerated life tests. From the reliability testing results, it was found that the WGPD structure yield
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::03e222f086052074597ff6aad27d3e9a
https://doi.org/10.1109/imfedk.2004.1566414
https://doi.org/10.1109/imfedk.2004.1566414
Publikováno v:
IEEE/CPMT/SEMI 29th International Electronics Manufacturing Technology Symposium (IEEE Cat. No.04CH37585).
With the need of high-speed and mass data transmission, optical communication system requires the growth of optical components. Waveguide photodiodes (WGPDs) are introduced and the circuit models of the WGPD and the WGPD submodule are required for th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7ed0ff491cc3af576a0b98ffbeed78ec
https://doi.org/10.1109/iemt.2004.1321640
https://doi.org/10.1109/iemt.2004.1321640