Zobrazeno 1 - 10
of 13
pro vyhledávání: '"Stuart N. Wooters"'
Autor:
Ian Byers, Stuart N. Wooters
Publikováno v:
2023 Fourth International Symposium on 3D Power Electronics Integration and Manufacturing (3D-PEIM).
Autor:
Stuart N. Wooters, Thang Nguyen
Publikováno v:
SAE International Journal of Passenger Cars - Electronic and Electrical Systems. 7:125-132
Autor:
Stuart N. Wooters, Randy W. Mann, Mircea R. Stan, Travis N. Blalock, Zhenyu Qi, Adam C. Cabe, Jiajing Wang, Benton H. Calhoun
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 20:1974-1985
Recent works show bias temperature instability (BTI) is a detrimental hard-aging mechanism in CMOS circuit design. Negative BTI (NBTI) alone degrades circuit speed upwards of 20% over a 10 year life-span. Having the ability to track the actual aging
Publikováno v:
IEEE Transactions on Circuits and Systems II: Express Briefs. 57:290-294
This brief presents a fast energy-efficient level converter capable of converting an input signal from subthreshold voltages up to the nominal supply voltage. Measured results from a 130-nm test chip show robust conversion from 188 mV to 1.2 V with n
Autor:
Nathan E. Roberts, Yousef Shakhsheer, Aatmesh Shrivastava, Stuart N. Wooters, Benton H. Calhoun, David D. Wentzloff, Kyle Craig
Publikováno v:
ISSCC
Batteryless operation and ultra-low-power (ULP) wireless communication will be two key enabling technologies as the IC industry races to keep pace with the IoE projections of 1T-connected sensors by 2025. Bluetooth Low-Energy (BLE) is used in many co
Publikováno v:
ISLPED
This paper describes a 130 nm CMOS sub-threshold (sub-VT) mixed-signal system-on-chip (SoC) that acquires and processes an electrocardiogram (ECG) signal for wireless ECG monitoring. Low power ECG devices permit continuous monitoring for longer durat
Publikováno v:
ISQED
On-chip circuit aging sources, like negative bias temperature instability (NBTI), hot-carrier injection (HCI), electromigration, and oxide breakdown, are reducing expected chip lifetimes. Being able to track the actual aging process is one way to avo
Autor:
Jocke, Steven C., Bolus, Jonathan F., Wooters, Stuart N., Blalock, Travis N., Calhoun, Benton H.
Publikováno v:
Proceedings of the 14th ACM/IEEE International Symposium: Low Power Electronics & Design; 8/19/2009, p117-118, 2p
Autor:
Fusco, Daniel, Balen, Tiago R.
Publikováno v:
2016 17th Latin-American Test Symposium (LATS); 2016, p111-116, 6p
Autor:
Sudha, D., Rani, Ch. Santhi
Publikováno v:
2014 IEEE International Conference on Computational Intelligence & Computing Research; 2014, p1-7, 7p