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Autor:
Bhargav Pandya, Deepak Veereddy, Mohamed Imam, John Ambrus, Reenu Garg, Tim McDonald, Alfonso Diy, Stuart Cardwell
Publikováno v:
2016 IEEE 4th Workshop on Wide Bandgap Power Devices and Applications (WiPDA).
The Safe Operating Area (SOA) characteristics of 600 V rated GaN-on-Si based cascode power devices in the Forward Bias (FB) and Short Circuit (SC) test conditions were evaluated in this study. The results from FBSOA tests at ≤ 150 °C device channe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ec693240ca70167a0b33d5cb8a9fd869
https://doi.org/10.1109/wipda.2016.7799930
https://doi.org/10.1109/wipda.2016.7799930
