Experimental characterization of bending effects for solid and hollow dielectric waveguides at V-band

Autor: Vu, Thanh-Luan, Barlerin, Stephane, Stricot, Yves, Sauleau, Ronan, Ettorre, Mauro, Gonzalez-Ovejero, David

Publikováno v: Scientific Reports
Scientific Reports, Nature Publishing Group, 2021, 11 (1), pp.20679. ⟨10.1038/s41598-021-00187-9⟩
Scientific Reports, Vol 11, Iss 1, Pp 1-10 (2021)
Scientific Reports, 2021, 11 (1), pp.20679. ⟨10.1038/s41598-021-00187-9⟩

Mm-wave dielectric waveguides are a promising and low-cost technology for the transmission of ultra-high data rates. Besides the attenuation (losses) and group delay, the bending loss of the dielectric waveguides is also one of the key parameters to

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=pmid_dedup__::d51bbb20d70faec26f0b628375815452
https://pubmed.ncbi.nlm.nih.gov/34667206