Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Steve Lytle"'
Autor:
Sun-Yuan Huang, Tom Mitcheltree, Michael Hughes, David Fisher, Douglas H. Wilson, Brian J. Roche, Matt Brown, Tatiana Berdinskikh, Steve Lytle
Publikováno v:
SPIE Proceedings.
This paper summarizes the correlation study between contamination and scratches on singlemode APC connectors and signal degradation; leading to an Acceptance Criteria Matrix. The study is a continuation of International Electronics Manufacturing Init
Autor:
Mike Hughes, Tatiana Berdinskikh, David Fisher, Sun-Yuan Huang, Tom Mitcheltree, Heather Tkalec, Aron Lau, Steve Lytle, Brian J. Roche, Douglas H. Wilson
Publikováno v:
OFC/NFOEC 2008 - 2008 Conference on Optical Fiber Communication/National Fiber Optic Engineers Conference.
This paper summarizes the latest research of iNEMI (International Electronics Manufacturing Initiative) on development of cleanliness specification for single-mode angle physical contact MT fiber optics connectors. The acceptance criteria matrix for
Autor:
Steve Lytle, Douglas H. Wilson, Brian J. Roche, F. Zhang, C. Gleason, J. Kilmer, Sun-Yuan Huang, Tatiana Berdinskikh, J. Garcia, A. Ho, Tom Mitcheltree, H. Tkalec
Publikováno v:
2006 Optical Fiber Communication Conference and the National Fiber Optic Engineers Conference.
Contaminated optical connectors result in degradation of optical performance, functional failures, and increased deployment costs. Currently there is no widely accepted cleanliness standard based on a systematic study of the impact of cleanliness on
Autor:
Carla Gleason, Tatiana Berdinskikh, Scott Takahashi, Thomas Mitcheltree, Steve Lytle, Yutaka Sadohara
Publikováno v:
Photonic Applications in Devices and Communication Systems.
The paper summarizes the research of the iNEMI (International Manufacturing Initiatives) project on Fiber Connector Endface Specifications focused on the development of the cleanliness specification of the receptacle modules. It will discuss (1) the
Autor:
Steve Lytle, Harland G. Tompkins
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 6:1032-1035
Auger depth profiles of aluminum for thicknesses varying from ∼200 to 2000 A are presented. The smearing of the inside interface is described using a previously developed algorithm where a sharp interface is assumed and a Gaussian convolution is ap
Autor:
Harland G. Tompkins, Steve Lytle
Publikováno v:
Journal of Applied Physics. 64:3269-3272
The alloy Ti:W was oxidized in 100% O2 at temperatures ranging from 375 to 505 °C. The resulting oxides were analyzed with Auger electron spectroscopy, x‐ray photoelectron spectroscopy, Rutherford backscattering spectroscopy, and ellipsometry. The
Conference
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