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pro vyhledávání: '"Steve Heineke"'
Autor:
Sam Subramanian, Jose Z. Garcia, Nelson Gomez, Steve Heineke, Kent Erington, Kris Dickson, Stefano Larentis, Khiem Ly, Tony Chrastecky
Publikováno v:
International Symposium for Testing and Failure Analysis.
As advanced silicon-on-insulator (SOI) technology becomes a more widespread technology offering, failure analysis approaches should be adapted to new device structures. We review two nanoprobing case studies of advanced SOI technology, detailing the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f4a25d2b74bec3f2117ba7a05d5393fd
https://doi.org/10.31399/asm.cp.istfa2019p0381
https://doi.org/10.31399/asm.cp.istfa2019p0381
