Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Steve G. Zane"'
Autor:
Will J. Marshall, Lois M. Bryman, Joseph Buriak, Troy C. Gehret, Kyung-Ho Park, Steve G. Zane, Thomas H. Scholz, Jeffrey S. Meth, Jerald Feldman, Charles D. McLaren, Kerwin D. Dobbs, Giang D. Vo
Publikováno v:
Organometallics. 34:3665-3669
Homoleptic fac-IrIIIL3 complexes of 5-aryl-4H-1,2,4-triazole ligands are sky blue emitters. When unsymmetrically substituted, the triazole ligands exhibit atropisomerism, and upon cyclometalation to Ir(III) a mixture of diastereomers is formed. We ha
Autor:
Barbara A. Wood, Sangah Gam, Michelle E. Seitz, Karen I. Winey, Jeffrey S. Meth, Russell J. Composto, Changzai Chi, Nigel Clarke, Steve G. Zane
Publikováno v:
Macromolecules. 44:3494-3501
Macromolecular motion is reduced in crowded polymer nanocomposites. Tracer diffusion is measured for deuterated polystyrene (dPS) into a polystyrene (PS):silica nanoparticle (NP) matrix using elastic recoil detection. This nanocomposite is ideal for
Publikováno v:
Applied Physics Letters. 84:2922-2924
We report the fabrication of dual insulated gate thin-film transistors with chemical-bath deposited cadmium sulfide active layers. The cadmium sulfide was deposited from solution onto thermally oxidized silicon wafers to form the first semiconductor
Autor:
Barbara A. Wood, Karen I. Winey, Sangah Gam, Nigel Clarke, Steve G. Zane, Russell J. Composto, Jeffrey S. Meth, Changzai Chi
Publikováno v:
Soft Matter. 8:6512
The tracer diffusion of deuterated polystyrene (dPS) is measured in a polystyrene nanocomposite containing silica nanoparticles (NPs), with number average diameters dn of 28.8 nm and 12.8 nm, using elastic recoil detection. The volume fractions of th
Autor:
Jerald Feldman, Giang D. Vo, Charles D. McLaren, Troy C. Gehret, Kyung-Ho Park, Jeffrey S. Meth, Will J. Marshall, Joseph Buriak, Lois M. Bryman, Kerwin D. Dobbs, Thomas H. Scholz, Steve G. Zane
Publikováno v:
Organometallics; Aug2015, Vol. 34 Issue 15, p3665-3669, 5p
Publikováno v:
Journal of Applied Physics. 98:104503
The effect of the chemical structure of the dielectric layer in organic thin-film transistors was examined by evaporating pentacene onto five different styrenic polymer dielectrics: poly(styrene), poly(4-hydroxystyrene), poly(4-methylstyrene), poly(4