Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Steve Burdin"'
Autor:
Min-Feng Yu, Ivan Petrov, Steve Burdin, Daniel P. Abraham, Martin Bettge, Seung Yoon Ryu, Ernie Sammann, Scott MacLaren
Publikováno v:
Journal of Power Sources. 206:288-294
Hierarchical surface morphologies form when thin films are deposited onto preexisting templates of vertically aligned wires using a line-of-sight deposition method, providing a facile path to experimental battery electrodes with high surface-to-volum
Autor:
Ivan Petrov, Martin Bettge, Min-Feng Yu, Scott MacLaren, Daniel P. Abraham, Ernie Sammann, Steve Burdin
Publikováno v:
Journal of Materials Research. 26:2247-2253
A rich research history exists for crystalline growth by vapor–liquid–solid (VLS) methods, but not for amorphous growth. Yet VLS growth in the absence of crystallographic influences provides an ideal laboratory for exploring surface energy effect
Publikováno v:
Ultramicroscopy. 108:646-655
We describe the design of a tandem instrument combining a low-energy electron microscope (LEEM) and a negative ion accelerator. This instrument provides video rate imaging of surface microtopography and the dynamics of its evolution during irradiatio
Autor:
Ivan Petrov, Richard T. Haasch, Min-Feng Yu, Scott MacLaren, Steve Burdin, Daniel P. Abraham, Ernie Sammann, Martin Bettge
Publikováno v:
Nanotechnology. 23(17)
It is a well-known fact that a sphere offers less surface area, and thus less surface energy, than any other arrangement of the same volume. From this perspective, all other shapes are metastable objects. In this paper, we present and discuss a manif
Autor:
Jiong Zhang, Jianguo Wen, Varistha Chobpattana, Ivan Petrov, Toshihiro Aoki, A. B. Shah, James C. Mabon, C. H. Lei, Ke Ran, Steve Burdin, Satoshi Mishina, Ernie Sammann, Jian-Min Zuo
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 16(2)
We evaluate the probe forming capability of a JEOL 2200FS transmission electron microscope equipped with a spherical aberration (Cs) probe corrector. The achievement of a real space sub-Angstrom (0.1 nm) probe for scanning transmission electron micro
Autor:
Scott MacLaren, Ivan Petrov, Steve Burdin, Martin Bettge, Daniel P. Abraham, Ernie Sammann, Jianguo Wen
Publikováno v:
Nanotechnology. 20:115607
Vertically aligned silicon oxide nanowires can be synthesized over a large area by a low-temperature, ion-enhanced, reactive vapour-liquid-solid (VLS) method. Synthesis of these randomly ordered arrays begins with a thin indium film deposited on a Si
Autor:
Martin Bettge, Scott MacLaren, Steve Burdin, Guo Wen, Daniel Abraham, Ivan Petrov, Ernie Sammann
Publikováno v:
Nanotechnology; Mar2009, Vol. 20 Issue 11, p15607-15607, 1p