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pro vyhledávání: '"Stephen W. Thayer"'
Autor:
David C. Noble, Phil F. Vanaria, Stuart M. Gleman, David L. Thompson, Stephen W. Thayer, Carl G. Hallberg, Paul A. Schwindt, Robert P. Mueller, Richard M. Davis, J. D. Collins
Publikováno v:
SPIE Proceedings.
During flight hardware processing at Kennedy Space Center, all critical surfaces are inspected for flaws such as scratches, gouges, raised metal and corrosion pitting. Key dimension of defects (maximum depth, width and length) are measured by one of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4ac16c0ac520dd8b1a9b2f53f57fb250
https://doi.org/10.1117/12.188826
https://doi.org/10.1117/12.188826
