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pro vyhledávání: '"Stephen M. Danauskas"'
Publikováno v:
Journal of Applied Crystallography. 41:1187-1193
Specular X-ray reflectivity data provide detailed information on the electron density distribution at an interface. Typical modeling methods involve choosing a generic electron density distribution based on an initial speculation of the electron dens
Autor:
Peter C. Jurs, Stephen M. Danauskas
Publikováno v:
Journal of Chemical Information and Computer Sciences. 41:419-424
Models predicting fullerene solubility in 96 solvents at 298 K were developed using multiple linear regression and feed-forward computational neural networks (CNN). The data set consisted of a diverse set of solvents with solubilities ranging from -3
Autor:
Peter C. Jurs, Stephen M. Danauskas
Publikováno v:
ChemInform. 32
Models predicting fullerene solubility in 96 solvents at 298 K were developed using multiple linear regression and feed-forward computational neural networks (CNN). The data set consisted of a dive...
Autor:
David R. Schultz, Jeffrey Gebhardt, Stephen M. Danauskas, Binhua Lin, Maria K. Ratajczak, Ka Yee C. Lee, Yuji Ishitsuka, Mati Meron
Publikováno v:
The Review of scientific instruments. 78(10)
We describe an integrated Brewster angle microscope (BAM), Langmuir trough, and grazing incidence x-ray diffraction assembly. The integration of these three techniques allows for the direct observation of radiative beam damage to a lipid monolayer at