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pro vyhledávání: '"Stephen J. B. Reed"'
Autor:
Stephen J. B. Reed
Publikováno v:
Microchimica Acta. 161:433-437
Synthetic multilayers consisting of alternating layers of materials with different X-ray scattering power take the place of ‘real’ crystals in wavelength-dispersive spectrometers for wavelengths greater than about 20 A and are used for analysing
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::37a5c77eaee95fe36f6ebd308f966d16
https://doi.org/10.1007/s00604-007-0892-y
https://doi.org/10.1007/s00604-007-0892-y
Autor:
Stephen J. B. Reed
Publikováno v:
Journal of Research of the National Institute of Standards and Technology
In setting up the conditions for quantitative wavelength-dispersive electron microprobe analysis a number of parameters have to be defined for each element, namely accelerating voltage, beam current, and (for each element) x-ray line, spectrometer cr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a1f83719a0816e3e29c1458b660bedc6
http://europepmc.org/articles/PMC4863850
http://europepmc.org/articles/PMC4863850
Autor:
Stephen J. B. Reed
Publikováno v:
Microchimica Acta. 132:145-151
“Trace” elements may be defined as elements whose concentrations are of a similar order to the detection limit. In WD analysis the detection limit is a function of the ‘figure of merit’ P2/B, where P is the pure-element peak intensity and B t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e9e2a736066a1cb4f0c13d11a7c85d1b
https://doi.org/10.1007/s006040050055
https://doi.org/10.1007/s006040050055
Autor:
Stephen J. B. Reed, A Buckley
Publikováno v:
Microchimica Acta. 132:153-155
Interferences (overlaps) occurring when lines of other elements affect either peak or background measurements can cause errors in quantitative WD analysis, but may be minimised by suitable choices of analysis conditions such as spectrometer crystal,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::70313f5107eaeb4f48d8e25d022a427d
https://doi.org/10.1007/s006040050056
https://doi.org/10.1007/s006040050056
Publikováno v:
JOURNAL OF PHYSICS-CONDENSED MATTER. 17(7)
Ionic diffusion in the quartz–β-eucryptite system is studied by DC transport measurements, SIMS and atomistic simulations. Transport data show a large transient increase in ionic current at the α–β phase transition of quartz (the Hedvall effec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::98ae3bb0a911aa50e494f408d97d58b6
http://ora.ox.ac.uk/objects/uuid:dda1f40b-7344-4cd8-90bc-20bc58250ee1
http://ora.ox.ac.uk/objects/uuid:dda1f40b-7344-4cd8-90bc-20bc58250ee1
Autor:
Stephen J. B. Reed
Publikováno v:
Modern Developments and Applications in Microbeam Analysis ISBN: 9783211831069
The mode of operation of wavelength-dispersive (WD) spectrometers as used in EPMA is described. Factors governing the resolution and intensity obtained with different crystals are discussed, with a view to assessing the scope for improvement and help
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fdc32fc1ecfd15d5ddbded06b8e56a80
https://doi.org/10.1007/978-3-7091-7506-4_4
https://doi.org/10.1007/978-3-7091-7506-4_4
Autor:
Stephen J. B. Reed
Publikováno v:
Microprobe Techniques in the Earth Sciences ISBN: 9780412551000
Electron probe microanalysis makes use of the X-ray spectrum emitted by a solid sample bombarded with a focused beam of electrons to obtain a localized chemical analysis. All elements from atomic number 4 (Be) to 92 (U) can be detected in principle,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::edecfa82cc60bf97a352bba4d5149fac
https://doi.org/10.1007/978-1-4615-2053-5_2
https://doi.org/10.1007/978-1-4615-2053-5_2
Autor:
Roger H. Mitchell, Stephen J. B. Reed
Publikováno v:
Mineralogical Magazine. 52:331-339
Ion microprobe analysis ofperovskite from kimberlites and alnöites permits the accurate determination of La, Ce, Pr, Nd, Sm, Eu, Gd, Dy, Er and Yb at the part per million level. Other rare earth elements (REE) are subject to interferences in the mas
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0555d9e412dea8dcee50fae637f52540
https://doi.org/10.1180/minmag.1988.052.366.04
https://doi.org/10.1180/minmag.1988.052.366.04