Zobrazeno 1 - 10
of 27
pro vyhledávání: '"Stephen Hudgens"'
Autor:
Stephen Hudgens
Publikováno v:
physica status solidi (b). 249:1951-1955
In the nearly 45 years since Stan Ovshinsky's original publication [Phys. Rev. Lett. 21, 1450 (1968)] announcing the discovery of electric-field-induced threshold switching in chalcogenide alloy semiconductor glass thin films, the field of amorphous
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1ff371cabdaecb362de6cbb85702e6aa
https://doi.org/10.1002/pssb.201200420
https://doi.org/10.1002/pssb.201200420
Publikováno v:
The Journal of Trauma: Injury, Infection, and Critical Care. 31:1408-1410
Tension pneumopericardium is uncommon in blunt trauma, and only rare survivors have been reported. We report two patients who survived tension pneumopericardium following blunt trauma. Both patients experienced signs and symptoms of cardiac tamponade
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8cfee36483b5a30ec3dd151d259f93e6
https://doi.org/10.1097/00005373-199110000-00018
https://doi.org/10.1097/00005373-199110000-00018
Autor:
Zia Karim, Lin Yang, Jerry Mack, Ming Liu, Ulrich Weber, Peter Baumann, Sasangan Ramanathan, Brian Lu, Wally Czubatyj, Stephen Hudgens, Tyler Lowrey
Publikováno v:
ECS Meeting Abstracts. :2808-2808
not Available.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2da7fe81c237d675680a4f77031da057
https://doi.org/10.1149/ma2012-02/37/2808
https://doi.org/10.1149/ma2012-02/37/2808
Publikováno v:
ACM Journal on Emerging Technologies in Computing Systems; Jul2021, Vol. 17 Issue 3, p1-44, 44p
Publikováno v:
Proceedings of the 2000 IEEE Aerospace Conference (Cat. No.00TH8484); 2000, pi-xxviii, 28p
Publikováno v:
IEEE Transactions on Electron Devices; Dec2012, Vol. 59 Issue 12, p3148-3177, 30p
Autor:
Hudgens, Stephen
Publikováno v:
Physica Status Solidi (B); Oct2012, Vol. 249 Issue 10, p1951-1955, 5p
Publikováno v:
IEEE Electron Device Letters; Dec2011, Vol. 32 Issue 12, p1620-1647, 28p
Publikováno v:
IEEE Electron Device Letters; 12/01/2010, Vol. 31 Issue 12, p1332-1357, 26p
Publikováno v:
IEEE Electron Device Letters; Dec2009, Vol. 30 Issue 12, p1228-1248, 21p