Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Stephen E. Mick"'
Autor:
Benjamin K. Miller, Stephen E. Mick
Publikováno v:
Microscopy and Microanalysis. 26:1172-1174
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d8d3c4b953b1fb4c9fa3c603e1cff463
https://doi.org/10.1017/s1431927620017213
https://doi.org/10.1017/s1431927620017213
Publikováno v:
Microscopy and Microanalysis. 27:288-289
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a62a573cf1f6d8d5975d4d6465137573
https://doi.org/10.1017/s1431927621001604
https://doi.org/10.1017/s1431927621001604
Autor:
Stephen E. Mick, Ben Miller
Publikováno v:
Microscopy and Microanalysis. 25:234-235
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6f966bd49ebd65dfbddce798295bba21
https://doi.org/10.1017/s1431927619001909
https://doi.org/10.1017/s1431927619001909
Publikováno v:
Microscopy and Microanalysis. 25:1718-1719
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5a4551957f889d373855837fecb147fc
https://doi.org/10.1017/s1431927619009322
https://doi.org/10.1017/s1431927619009322
Publikováno v:
Microscopy and Microanalysis. 24:1882-1883
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d5f9401a3d428045f8435c7575af0c5c
https://doi.org/10.1017/s1431927618009893
https://doi.org/10.1017/s1431927618009893
Autor:
Stephen E. Mick, Benjamin K. Miller
Publikováno v:
Microscopy and Microanalysis. 23:958-959
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d19ad67ae4cab0b120c276a476d7de31
https://doi.org/10.1017/s1431927617005451
https://doi.org/10.1017/s1431927617005451
Autor:
Denis Fellmann, Stephen E. Mick, John Damiano, Clinton S. Potter, David P. Nackashi, Bridget Carragher, Joel Quispe, Teddy G. Ajero
Publikováno v:
Microscopy and Microanalysis. 13:365-371
Two issues that often impact the cryo-electron microscopy (cryoEM) specimen preparation process are agglomeration of particles near hole edges in holey carbon films and variations in vitreous ice thickness. In many cases, the source of these issues w
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c655127b0e8907e5f4199d49506fdb4a
https://doi.org/10.1017/s1431927607070791
https://doi.org/10.1017/s1431927607070791
Publikováno v:
Microscopy and Microanalysis. 14:792-793
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cbd112cb772273e9f0d985c0bc10fd3f
https://doi.org/10.1017/s1431927608086406
https://doi.org/10.1017/s1431927608086406
Publikováno v:
Microscopy and Microanalysis. 14:1332-1333
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6b45b92c733f82199f8c4c93ee34c60a
https://doi.org/10.1017/s1431927608088363
https://doi.org/10.1017/s1431927608088363
Autor:
Joel Quispe, John Damiano, Stephen E. Mick, David P. Nackashi, Denis Fellmann, Teddy G. Ajero, Bridget Carragher, Clinton S. Potter
Publikováno v:
Microscopy & Microanalysis; Oct2007, Vol. 13 Issue 5, p365-371, 7p