Zobrazeno 1 - 10
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pro vyhledávání: '"Stephen, P. Clough"'
Publikováno v:
SPIE Proceedings.
Identification of particular defects plays a key role in achieving high yields for semiconductor device processing. This can be especially significant while developing and ramping new processes and technology nodes, and during efforts to recover from
Publikováno v:
The 1998 international conference on characterization and metrology for ULSI technology.
The challenges associated with analyzing semiconductor defects become greater as the device design rule decreases. According to the SIA National Technology Roadmap for Semiconductors, the current metrology requirement for particle analysis is 90 nm w
Publikováno v:
Metrology, Inspection, and Process Control for Microlithography X.
The semiconductor industry has demonstrated the need for off-line, capital intensive analytical instruments to increase semiconductor yields through quick and accurate analysis of detected defects. Leading edge semiconductor devices currently employ
Autor:
Steven M. Tuominen, Stephen P. Clough
Publikováno v:
Metallurgical Transactions A. 10:127-129
Working of sintered polycrystalline, powder-metallurgy molybden is necessary to increase its strength, ductility, and fracture resistance. A portion of a study that determined the partitioning of impurities between the grain boundaries and the grain
Publikováno v:
Adhesives, Sealants, and Coatings for Space and Harsh Environments ISBN: 9781461283089
Cr(III) fumarato coordination compound is a successful coupling agent for aluminum-polyethylene adhesion. When an aluminum foil was pretreated with the Cr(III) fumarato coupling agent and coated with polyethylene, the aluminum-polyethylene composite
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d76b2758270ed501a9f235571fc6db8a
https://doi.org/10.1007/978-1-4613-1047-1_14
https://doi.org/10.1007/978-1-4613-1047-1_14
Autor:
Stephen, P. Clough, William, J. Eberle, Gillman, Gilbert, Stephen, P. Clough, William, J. Eberle, Gillman, Gilbert
Publikováno v:
Matériaux & Techniques; January 1989, Vol. 77 Issue: 3 p33-34, 2p
Autor:
Stephen, P. Clough, William, J. Eberle, Gillman, Gilbert, Stephen, P. Clough, William, J. Eberle, Gillman, Gilbert
Publikováno v:
Matériaux & Techniques; January 1989, Vol. 77 Issue: 3 p34-35, 2p
Akademický článek
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Conference
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