An Overview on Gripping Force Measurement at the Micro and Nano-Scales Using Two-Fingered Microrobotic Systems

Autor: Mokrane Boudaoud, Stephane Regnier

Publikováno v: International Journal of Advanced Robotic Systems, Vol 11 (2014)

Two-fingered micromanipulation systems with an integrated force sensor are widely used in robotics to sense and control gripping forces at the micro and nano-scales. They became of primary importance for an efficient manipulation and characterization

Externí odkaz: https://doaj.org/article/02c134690e86441c93821f6c2a0a072f

Atomic Force Microscope Vertical Feedback Control Strategy for Semi-Automated Long-Range Probe Landing

Autor: Freddy Romero Leiro, Georges Daher, Stephane Regnier, Mokrane Boudaoud

Publikováno v: 2022 IEEE 61st Conference on Decision and Control (CDC).

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::85a28888e701c689ac5e4a4e67f48ecd
https://doi.org/10.1109/cdc51059.2022.9992978

The independence of oscillatory reconnection periodicity from the initial pulse

Autor: Gert Botha, Stephane Regnier, James McLaughlin, Konstantinos Karampelas

Oscillatory reconnection can manifest through the interaction between the ubiquitous MHD waves and omnipresent null points in the solar atmosphere and is characterized by an inherent periodicity. In the current study, we focus on the relationship bet

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d9ecd0eb2f8c17295640216262e33dfe
http://arxiv.org/abs/2207.01980

Model Predictive Control With Obstacle Avoidance for Inertia Actuated AFM Probes Inside a Scanning Electron Microscope

Autor: Shuai Liang, Stephane Regnier, Jonathan Cailliez, Mokrane Boudaoud, Weibin Rong, Barthelemy Cagneau, Pascal Morin

Publikováno v: IEEE Robotics and Automation Letters
IEEE Robotics and Automation Letters, IEEE 2021, 6 (2), pp.382-388. ⟨10.1109/LRA.2020.2974388⟩
IEEE Robotics and Automation Letters, 2021, 6 (2), pp.382-388. ⟨10.1109/LRA.2020.2974388⟩

The Atomic Force Microscope (AFM) is a reliable tool for 3D imaging and manipulation at the micrometer and nanometer scales. When used inside a Scanning Electron Microscope (SEM), AFM probes can be localized and controlled with a nanometer resolution

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4f475d5fc3ede192dcb078adec6c5370
https://doi.org/10.1109/lra.2020.2974388

Hysteresis in nanopositioning systems driven by dual-stack differential driving piezoelectric actuators

Autor: Zhiyong Chen, Ali Bazaei, Hai-Tao Zhang, Stephane Regnier, Mokrane Boudaoud, Massoud Hemmasian Ettefagh, Zhiyue Wang

Publikováno v: IFAC-PapersOnLine. 53:8599-8604

The existence of hysteresis phenomenon in piezoelectric actuators of nanopositioners adversely affects their performance, e.g. image distortion in Atomic Force Microscopy. A usual approach to circumnavigate hysteresis nonlinearity is feedforward comp

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::8593b9ef60028ceb3cbc9c22c7d670e2
https://doi.org/10.1016/j.ifacol.2020.12.524