Zobrazeno 1 - 10 of 17 pro vyhledávání: '"Stephan Kujawa"'
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Focused Ion Beam Preparation of Specimens for Micro-Electro-Mechanical System-based Transmission Electron Microscopy Heating Experiments
Autor: Jens Greiser, Joerg R. Jinschek, Sriram Vijayan, Stephan Kujawa, Mark Aindow
Publikováno v: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 23(4)
Micro-electro-mechanical systems (MEMS)-based heating holders offer exceptional control of temperature and heating/cooling rates for transmission electron microscopy experiments. The use of such devices is relatively straightforward for nano-particul
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b7dca065bd9913ece4a579c25dad0d05
https://pubmed.ncbi.nlm.nih.gov/28578727
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5
State of the art in atomic resolution off-axis electron holography
Autor: Bert Freitag, Martin Linck, Tore Niermann, Stephan Kujawa, Michael Lehmann
Publikováno v: Ultramicroscopy. 116:13-23
As proposed by Hannes Lichte, to resolve structure–property relations not only the question “Which atom is where?” but also the question “Which fields are around?” has to be answered. High-resolution off-axis electron holography opens up an
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::c6c732567afc9dcf1d552502b0c3763a
https://doi.org/10.1016/j.ultramic.2012.01.019
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8
Breaking the spherical and chromatic aberration barrier in transmission electron microscopy
Autor: J. Ringnalda, P.M. Mul, Peter Tiemeijer, Bert Freitag, Stephan Kujawa
Publikováno v: Ultramicroscopy. 102(3)
Since the invention of transmission electron microscopy (TEM) in 1932 (Z. Physik 78 (1932) 318) engineering improvements have advanced system resolutions to levels that are now limited only by the two fundamental aberrations of electron lenses; spher
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f9240bb3ba39ead9c318bea26f0baed3
https://pubmed.ncbi.nlm.nih.gov/15639351
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9
Analytical transmission electron microscopy in the third dimension
Autor: Oleg Lourie, Daniela Sudfeld, Stephan Kujawa
Publikováno v: Journal of Physics: Conference Series. 522:012026
For researchers in metallurgy, energy storage or functional nanomaterials, where elemental distribution is crucial to performance, full characterization is more difficult by decreasing feature sizes and increasingly complex architectures. Two-dimensi
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::5d822e0ea573ee8f9fe97744b6ec6021
https://doi.org/10.1088/1742-6596/522/1/012026
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