Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Stephan Bradler"'
Publikováno v:
Journal of The Electrochemical Society. 164:A744-A749
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0d0c4996d962687a4b7ec8cd10f179cc
https://doi.org/10.1149/2.1111704jes
https://doi.org/10.1149/2.1111704jes
Publikováno v:
The Journal of Physical Chemistry C. 120:11947-11955
The molecular structure of the ionic liquid–electrode interface has been recently investigated by atomic force microscopy (AFM) methods focusing either on the vertical structure of the ion layers or on the lateral structure of the innermost layer.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e519a10fbe0f9a45bd9a3ee81c8659be
https://doi.org/10.1021/acs.jpcc.6b02232
https://doi.org/10.1021/acs.jpcc.6b02232
Autor:
Elisabeth Hornberger, Julia Zakel, Kerstin Volz, Katharina I. Gries, Bernhard Roling, Sebastian Kranz, Michael Gellert, Fabio Rosciano, Stephan Bradler, Sandra Müller, Chihiro Yada
Publikováno v:
Journal of The Electrochemical Society. 162:A754-A759
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::50cb7707be0e4a1daa62e5a2aab07704
https://doi.org/10.1149/2.0891504jes
https://doi.org/10.1149/2.0891504jes
Publikováno v:
Journal of Applied Physics. 123:035106
Contact-resonance atomic force microscopy allows the quantitative mapping of local viscoelastic and electromechanical properties. Excitation and amplification are generally described by the damped harmonic oscillator (DHO) model. The dual AC resonanc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a61721d49d273b52a24c306769bd0cb5
https://doi.org/10.1063/1.5004472
https://doi.org/10.1063/1.5004472
Publikováno v:
Journal of Applied Physics. 122:065106
Voltage-modulated force spectroscopy techniques, such as electrochemical strain microscopy and piezoresponse force microscopy, are powerful tools for characterizing electromechanical properties on the nanoscale. In order to correctly interpret the re
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::95343cd3256e7f1f61d309738036eb48
https://doi.org/10.1063/1.4998435
https://doi.org/10.1063/1.4998435
Publikováno v:
Journal of Applied Physics. 121:224302
Electrochemical strain microscopy (ESM) is based on the detection of the surface deformation of electrochemical materials induced by local electrical excitation via an AFM tip. Here, we compare the two common excitation methods, dual ac resonance tra
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1084d51a30e1ecc1d82c444823026119
https://doi.org/10.1063/1.4984831
https://doi.org/10.1063/1.4984831
Publikováno v:
Journal of Applied Physics. 120:165107
Contact-resonance scanning probe techniques are frequently used for characterizing the mechanical sample properties via atomic force acoustic/ultrasonic microscopy as well as for detecting sample displacement via piezoresponse force microscopy (PFM)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6c36e34c116639044aa4cd2479150564
https://doi.org/10.1063/1.4964942
https://doi.org/10.1063/1.4964942