A model to predict image formation in the three-dimensional field ion microscope

Autor: Nicolas Rolland, Shyam Katnagallu, Rodrigue Lardé, Benjamin Klaes, Fabien Delaroche, Stefan Parviainen, Baptiste Gault, François Vurpillot

Publikováno v: Computer Physics Communications
Computer Physics Communications, 2020, pp.107317. ⟨10.1016/j.cpc.2020.107317⟩
Computer Physics Communications, Elsevier, 2020, pp.107317. ⟨10.1016/j.cpc.2020.107317⟩

Field ion microscopy (FIM) was the first technique to image individual atoms on the surface of a material. By a careful control of the field evaporation of surface atoms, the bulk of the material is exposed, and, through digital processing of a seque

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::01c7d4b38ab742bcc1e8669c8e2817fb
https://normandie-univ.hal.science/hal-02571970/document

Diffusion bonding of Cu atoms with molecular dynamics simulations

Autor: Flyura Djurabekova, Stefan Parviainen, A. Xydou

Publikováno v: Results in Physics, Vol 16, Iss, Pp 102890-(2020)

Diffusion bonding of copper disks is an important step during the assembly of accelerating structures -the main components of power radio-frequency linear accelerators-. During the diffusion bonding copper disks are subjected to pressure at high temp

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d3719f40111ceee449e701323113fae2
https://doi.org/10.1016/j.rinp.2019.102890

Impact of local electrostatic field rearrangement on field ionization

Autor: Blazej Grabowski, Nicolas Rolland, Dierk Raabe, Michael P. Moody, Stefan Parviainen, Joerg Neugebauer, Baptiste Gault, Michal Dagan, Paul A. J. Bagot, Shyam Katnagallu, François Vurpillot, Ali Nematollahi

Publikováno v: Journal of Physics D: Applied Physics
Journal of Physics D: Applied Physics, IOP Publishing, 2018, 51 (10), pp.105601. ⟨10.1088/1361-6463/aaaba6⟩
Journal of Physics D: Applied Physics, 2018, 51 (10), pp.105601. ⟨10.1088/1361-6463/aaaba6⟩

© 2018 IOP Publishing Ltd. Field ion microscopy allows for direct imaging of surfaces with true atomic resolution. The high charge density distribution on the surface generates an intense electric field that can induce ionization of gas atoms. We in

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http://ora.ox.ac.uk/objects/uuid:

Reconstructing APT Datasets: Challenging the Limits of the Possible

Autor: David Zanuttini, James S. Speck, Baishaikhi Mazumder, Nicolas Rolland, Constantinos Hatzoglou, Stefan Parviainen, François Vurpillot

Publikováno v: Microscopy and Microanalysis
Microscopy and Microanalysis, Cambridge University Press (CUP), 2017, 23 (S1), pp.640-641. ⟨10.1017/S1431927617003865⟩
Microscopy and Microanalysis, 2017, 23 (S1), pp.640-641. ⟨10.1017/S1431927617003865⟩

International audience; Atom probe tomography (APT) has been successfully used in materials science for several decades for probing local compositional variations. In metals, the capacity to measure reliable composition at the nanoscale in 3D was suc

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c7205103083079e4205ccc4e7fc2d6af
https://hal.archives-ouvertes.fr/hal-02107482

Molecular dynamics simulations of ion irradiation of a surface under an electric field

Autor: Flyura Djurabekova, Stefan Parviainen

Publikováno v: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 339:63-66

The presence of high electric fields may affect significantly the process of sputtering of metal surfaces by energetic ions, especially in the vicinity of rough surface features. The effect can be significant if the energy of ions is fairly low. More

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::f9c4b09d81e26ff00dbf5c8b1851584a
https://doi.org/10.1016/j.nimb.2014.03.009