Zobrazeno 1 - 10
of 13
pro vyhledávání: '"Stefan Krivec"'
Publikováno v:
Surface and Interface Analysis. 53:675-680
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0ba35f4a8cbf17870daa0ebeca28fc69
https://doi.org/10.1002/sia.6956
https://doi.org/10.1002/sia.6956
Publikováno v:
Analytical Chemistry. 89:2377-2382
A sputter beam, consisting of large O2 clusters, was used to record depth profiles of alkali metal ions (Me+) within thin SiO2 layers. The O2 gas cluster ion beam (O2-GCIB) exhibits an erosion rate comparable to the frequently used O2+ projectiles. H
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b1812c12b8bfb6b8641dc348966defa8
https://doi.org/10.1021/acs.analchem.6b04222
https://doi.org/10.1021/acs.analchem.6b04222
Publikováno v:
Surface and Interface Analysis. 48:636-649
The behavior of Na+ and K+ migration upon insertion from a polymeric host matrix into different SiOx layers deposited by chemical vapor deposition is investigated via triangular voltage sweep (TVS) measurements. It is indicated that the quality of th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c8c3b6680b01051c87a707d6b9a15bbb
https://doi.org/10.1002/sia.5974
https://doi.org/10.1002/sia.5974
Publikováno v:
Analytical chemistry. 89(4)
A sputter beam, consisting of large O
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::04aa74076fbcb633feef00b390db1bd4
https://pubmed.ncbi.nlm.nih.gov/28192950
https://pubmed.ncbi.nlm.nih.gov/28192950
On the temperature dependence of Na migration in thin SiO2 films during ToF-SIMS O2+ depth profiling
Publikováno v:
Applied Surface Science. 257:25-32
The detection of Na in insulating samples by means of time of flight-secondary ion mass spectrometry (ToF-SIMS) depth profiling has always been a challenge. In particular the use of O 2 + as sputter species causes a severe artifact in the Na depth di
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::be3dd09cbc8a13e60a97b4d5124fbb3f
https://doi.org/10.1016/j.apsusc.2010.06.019
https://doi.org/10.1016/j.apsusc.2010.06.019
Publikováno v:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 36:03F129
Distribution of alkali metals within thin insulating films as recorded by time of flight secondary ion mass spectrometry (ToF-SIMS) dual beam depth profiling using O2+ as the sputter projectile is usually exhibiting artifacts. Positive charges appear
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1e59e5feb74b3817c0d348562fa44cfe
https://doi.org/10.1116/1.5019659
https://doi.org/10.1116/1.5019659
Publikováno v:
Surface and Interface Analysis. 42:886-890
Na + is a well-known contaminant in metal-oxide-semiconductor field effect transistor devices, which may cause severe changes in their input characteristics. This work is addressed to investigate the incorporation and transport behavior of mobile Na
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::582d0e2dfd484c383cf3f142bb9d2c7b
https://doi.org/10.1002/sia.3240
https://doi.org/10.1002/sia.3240
Autor:
Helga C. Lichtenegger, Volker Schmidt, Werner Grogger, Nicole Galler, Stefan Krivec, Robert Liska, Valentin Satzinger, Thomas Koch, Nadejda B. Matsko, Niklas Pucher
Publikováno v:
Advanced Functional Materials. 20:811-819
The three-dimensional fabrication of optical waveguides has gained increasing interest in recent years to establish interconnections between electrical components on a very small scale where copper circuits encounter severe limitations. In this work
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d81222838c3b63b62e9c8eaeb32d49f4
https://doi.org/10.1002/adfm.200901790
https://doi.org/10.1002/adfm.200901790
Autor:
Thomas Detzel, Stefan Krivec, Herbert Hutter, Juergen Fleig, Till Froemling, Michael Buchmayr
Publikováno v:
Analytical and bioanalytical chemistry. 400(3)
The action of Na(+) incorporation into thin insulating films and transport therein under influence of a bias voltage and temperature (BT stress) is the subject of this work. Deposited onto highly n-doped Si wafers, the insulators get BT stressed and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::04e176ac56cbb4514b4aacd23c23606c
https://pubmed.ncbi.nlm.nih.gov/21331494
https://pubmed.ncbi.nlm.nih.gov/21331494
Autor:
Ahmet Ata Akatay, Nicolas Pavillon, Christian Depeursinge, Jonas Kühn, Etienne Cuche, Frédéric Montfort, Yves Emery, Tristan Colomb, Stefan Krivec, Herbert Hutter
Publikováno v:
Optics Express
ResearcherID
ResearcherID
Digital holographic microscopy (DHM) is an interferometric technique that allows real-time imaging of the entire complex optical wavefront (amplitude and phase) reflected by or transmitted through a sample. To our knowledge, only the quantitative pha
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::33a4598f1c0e67f9c5fbdcfd7b1470cf