Zobrazeno 1 - 10
of 53
pro vyhledávání: '"Stawiasz, K."'
Publikováno v:
2013 Proceedings of the ESSCIRC (ESSCIRC); 2013, p419-422, 4p
Publikováno v:
2008 IEEE International Reliability Physics Symposium; 2008, p532-535, 4p
Publikováno v:
IEEE International Electron Devices Meeting, 2005. IEDM Technical Digest; 2005, p659-662, 4p
Publikováno v:
ESSCIRC 2004 - 29th European Solid-State Circuits Conference (IEEE Cat. No.03EX705); 2003, p635-638, 4p
Publikováno v:
Proceedings 16th IEEE VLSI Test Symposium (Cat No98TB100231); 1998, p234-238, 5p
Autor:
Kosonocky, S.V., Bright, A., Warren, K., Haring, R.A., Klepner, S., Asaad, S., Basavaiah, S., Havreluk, B., Heidel, D., Immediato, M., Jenkin, K., Joshi, R., Parker, B., Rajeevakumar, T.V., Stawiasz, K.
Publikováno v:
Proceedings 16th IEEE VLSI Test Symposium (Cat No98TB100231); 1998, p2-7, 6p
Publikováno v:
1997 Proceedings 47th Electronic Components & Technology Conference; 1997, p217-224, 8p
Autor:
Crow, J.D., Joong-Ho Choi, Cohen, M.S., Johnson, G., Kuchta, D., Lacey, D., Ponnapalli, S., Pepeljugoski, P., Stawiasz, K., Trewhella, J., Xiao, P., Tremblay, S., Ouimet, S., Lacerte, A., Gauvin, M., Booth, D., Nation, W., Smith, T.L., DeBaun, B.A., Henson, G.D.
Publikováno v:
1996 Proceedings 46th Electronic Components & Technology Conference; 1996, p292-300, 9p
Autor:
Wong, Y.M., Muehlner, D.J., Faudskar, C.C., Fishteyn, M., Gates, J.V., Anthony, P.J., Cyr, G.J., Choi, J., Crow, J.D., Kuchta, D.M., Pepeljugoski, P.K., Stawiasz, K., Nation, W., Engebretsen, D., Whitlock, B., Morgan, R.A., Hibbs-Brenner, M.K., Lehman, J., Walterson, R., Kalweit, E.
Publikováno v:
1996 Proceedings 46th Electronic Components & Technology Conference; 1996, p269-278, 10p
Publikováno v:
2nd International Conference on ASIC; 1996, p252-255, 4p