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pro vyhledávání: '"Stanley L. Hurst"'
Publikováno v:
The American Journal of Dermatopathology. 40:209-211
Seborrheic keratoses, although exceedingly common, occasionally have morphologic similarities to other lesions that complicate a typically straightforward diagnosis. The authors present a case of a 69-year-old man with a left shoulder lesion that dis
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::48e4a8bd1aefc994bc30613c34a4026b
https://doi.org/10.1097/dad.0000000000000992
https://doi.org/10.1097/dad.0000000000000992
Autor:
Stanley L. Hurst
Publikováno v:
VLSI Testing: digital and mixed analogue/digital techniques ISBN: 9780852969014
In considering the techniques that may be used for digital circuit testing, two distinct philosophies may be found, namely: (a) to undertake a series of functional tests and check for the correct (fault free) 0 or 1 output response(s); (b) to conside
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::412ed0a16ff50f401fddfa73be150fb7
https://doi.org/10.1049/pbcs009e_ch2
https://doi.org/10.1049/pbcs009e_ch2
Autor:
Stanley L. Hurst
Publikováno v:
VLSI Testing: digital and mixed analogue/digital techniques ISBN: 9780852969014
The following gives the positions in n-stage autonomous cellular automata of the type 150 cells necessary to produce a maximum-length sequence of 2n - 1 states. All remaining cells in the n-stage string of cells are the simpler type 90 cells.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::24d7d35490e095cf38fee51135fae074
https://doi.org/10.1049/pbcs009e_appendixb
https://doi.org/10.1049/pbcs009e_appendixb
Autor:
Stanley L. Hurst
Publikováno v:
VLSI Testing: digital and mixed analogue/digital techniques ISBN: 9780852969014
In this chapter we will consider means which have been proposed to ease the task of checking the output response when under test, so that the very large number of individual 0 or 1 output bits do not have to be compared step by step against the expec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ed92ad97aae4cb6d9641745cac37c145
https://doi.org/10.1049/pbcs009e_ch4
https://doi.org/10.1049/pbcs009e_ch4
Autor:
Stanley L. Hurst
Publikováno v:
VLSI Testing: digital and mixed analogue/digital techniques ISBN: 9780852969014
In Chapter 1 it was shown that the defect level, DL, after test was given by the theoretical relationship DL={1 - Y(1 - FC)} x 100 %. Both the 'goodness' of the fabrication process, the yield, Y, and the effectiveness of the testing procedure, FC, ar
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2a19b9738a99a313b4fd065f481b21c6
https://doi.org/10.1049/pbcs009e_appendixc
https://doi.org/10.1049/pbcs009e_appendixc
Autor:
Stanley L. Hurst
Publikováno v:
VLSI Testing: digital and mixed analogue/digital techniques ISBN: 9780852969014
This chapter considers several strategies for generating tests for digital circuits which, with the noticeable exception of I DDQ testing involve the monitoring of the 0 and 1 primary output response to appropriate input test vectors. By far the grea
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8f6b1956574c38435ed0a72a03ae0cb1
https://doi.org/10.1049/pbcs009e_ch3
https://doi.org/10.1049/pbcs009e_ch3
Autor:
Stanley L. Hurst
Publikováno v:
VLSI Testing: digital and mixed analogue/digital techniques ISBN: 9780852969014
Because of the difficulties or complexities encountered when formulating acceptable tests for integrated circuits as they become larger and more complex, it is now essential to consider testing at the design stage of a VLSI circuit or system using VL
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bb6e852e9fc6a5126a679f0395126721
https://doi.org/10.1049/pbcs009e_ch5
https://doi.org/10.1049/pbcs009e_ch5
Autor:
Stanley L. Hurst
Publikováno v:
VLSI Testing: digital and mixed analogue/digital techniques ISBN: 9780852969014
The overall importance of costing does not need emphasising, since it is the responsibility of every vendor and OEM not to make a financial loss across their range of products. Microelectronic costs, however, may be difficult to assess, and may be ba
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::aa8a94ff972be5c8fae3da0d7edba782
https://doi.org/10.1049/pbcs009e_ch9
https://doi.org/10.1049/pbcs009e_ch9
Autor:
Stanley L. Hurst
Publikováno v:
VLSI Testing: digital and mixed analogue/digital techniques ISBN: 9780852969014
In this chapter uncertainty in the practice of mixed-signal VLSI testing is discussed. In spite of considerable efforts from the mid 1980s onwards, when mixed-signal ICs began to grow from manageable MSI size towards LSI and VLSI complexities, the su
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bcac9adaf5478331d87876c127eb5745
https://doi.org/10.1049/pbcs009e_ch8
https://doi.org/10.1049/pbcs009e_ch8