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pro vyhledávání: '"Stanislav V. Sevostianov"'
Autor:
Oleksandr M. Slobodian, Peter M. Lytvyn, Andrii S. Nikolenko, Victor M. Naseka, Oleg Yu. Khyzhun, Andrey V. Vasin, Stanislav V. Sevostianov, Alexei N. Nazarov
Publikováno v:
Nanoscale Research Letters, Vol 13, Iss 1, Pp 1-11 (2018)
Abstract Graphene oxide (GO) films were formed by drop-casting method and were studied by FTIR spectroscopy, micro-Raman spectroscopy (mRS), X-ray photoelectron spectroscopy (XPS), four-points probe method, atomic force microscopy (AFM), and scanning
Externí odkaz:
https://doaj.org/article/a5e7a5107afb48f7af728c49d7e8ed38