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pro vyhledávání: '"Stahl, Lucas"'
Publikováno v:
Scientific Reports, Vol 10, Iss 1, Pp 1-6 (2020)
Scientific Reports
Scientific Reports
A method for defect characterization is presented that allows to measure the activation energy, capture cross-section, and defect density in dielectric materials. This is exemplarily performed on aluminum oxide thin films deposited on hydrogen-termin
Publikováno v:
Journal of Applied Research; Summer2004, Vol. 4 Issue 3, p19-395, 11p, 2 Charts, 5 Graphs