Effective Maintenance by Reducing Failure-Cause Misdiagnosis in Semiconductor Industry (SI)

Autor: Asma Abu-Samah, Muhammad Kashif Shahzad, Eric Zamaï, Stéphane Hubac

Publikováno v: International Journal of Prognostics and Health Management, Vol 6, Iss 1 (2015)

Increasing demand diversity and volume in semiconductor industry (SI) have resulted in shorter product life cycles. This competitive environment, with high-mix low-volume production, requires sustainable production capacities that can be achieved by

Externí odkaz: https://doaj.org/article/cd566a04c9f34333bffe5041d7cac889

Towards proactive maintenance actions scheduling in the Semiconductor Industry (SI) using Bayesian approach

Autor: Muhammad Kashif Shahzad, Michel Tollenaere, Anis Ben Said, Stéphane Hubac, Éric Zamaï

Publikováno v: IFAC-PapersOnLine. 49:544-549

The Semiconductor Industry (SI) is one of the fastest growing manufacturing domains challenged by the high-mix low-volume production and short product life cycles. This results an increase in unscheduled equipment breakdowns that often result in decr

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::b77b0c96292f9dbdd21eaed838eba41e
https://doi.org/10.1016/j.ifacol.2016.07.692

Experts' Knowledge Renewal and Maintenance Actions Effectiveness in High-Mix Low-Volume Industries, Using Bayesian Approach

Autor: Muhammad Kashif Shahzad, Anis Ben Said, Stéphane Hubac, Éric Zamaï, Michel Tollenaere

Publikováno v: Cognition, Technology and Work
Cognition, Technology and Work, Springer Verlag, 2015, 18 (1), pp.193-213

Increasing demand diversity has resulted in high-mix low-volume production where success depends on the ability to quickly design and develop new products. This requires sustainable production capacities and efficient equipment utilization which are

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5090ca8445d1e9156656225e4596fb9e
https://hal.archives-ouvertes.fr/hal-01201796

Towards a Bayesian Network methodology to improve maintenance of complex semiconductor systems

Autor: Mohammed Farouk Bouaziz, F. Duvivier, S. Monot, Éric Zamaï, Stéphane Hubac

Publikováno v: 21st European Safety and Reliability Conference (ESREL 2011)
21st European Safety and Reliability Conference (ESREL 2011), Sep 2011, Troyes, France. Chapter N°16, pp 116-123, ⟨10.1201/b11433-20⟩

International audience; The evolution of microelectronics is characterized by an intense competitive environment between manufacturers; so, the semiconductor product must be done with reduced cycle time, improved yield and enhanced equipment effectiv

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2515750da534c6d316b0da9c6b79de00
https://hal.archives-ouvertes.fr/hal-00685619

An Extended IDM Business Model to Ensure Time-to-Quality in Semiconductor Manufacturing Industry

Autor: Ali Siadat, Michel Tollenaere, Muhammad Kashif Shahzad, Stéphane Hubac

Publikováno v: Communications in Computer and Information Science ISBN: 9783642243578
CENTERIS (1)
International Conference, CENTERIS 2011
International Conference, CENTERIS 2011, Oct 2011, Vilamoura, Algarve, Portugal, Portugal. pp.118-128, ⟨10.1007/978-3-642-24358-5_12⟩

International audience; Semiconductor manufacturing industry (SMI) has shifted from an IDM (integrated device manufacturer) to a fabless structure where technology is developed in an alliance to share high R&D costs and address time to market and tim

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4925cca09eeb139310d47a698654c2b3
https://doi.org/10.1007/978-3-642-24358-5_12