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pro vyhledávání: '"Srivatsan Venkatesan"'
Autor:
Srivardhan Gowda, Art B. Reyes, Oliver H. Eagle, Srivatsan Venkatesan, Vikram V. Iyengar, Suresh Chandrasekaran
Publikováno v:
2014 IEEE Workshop On Microelectronics And Electron Devices (WMED).
In this paper, the effect of Shallow Trench Isolation (STI) degradation on program disturb is studied. It is reported that trench isolation is compromised with non-uniformity in trench depth leading to increased boost loss through field isolation lea
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a6774478b912f8b7060b82f4d982559e
https://doi.org/10.1109/wmed.2014.6818718
https://doi.org/10.1109/wmed.2014.6818718
