Zobrazeno 1 - 10
of 113
pro vyhledávání: '"Srivaths Ravi"'
Autor:
Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
Publikováno v:
Journal of Electronic Testing. 39:57-69
Autor:
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
Publikováno v:
Journal of Electronic Testing. 38:637-651
Autor:
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
Publikováno v:
2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).
Autor:
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
Publikováno v:
2022 IEEE International Test Conference (ITC).
Autor:
Abraham Steenhoek, Praise O. Farayola, Isaac Bruce, Shravan Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
Publikováno v:
2022 IEEE European Test Symposium (ETS).
Autor:
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
Publikováno v:
2022 IEEE 40th VLSI Test Symposium (VTS).
Autor:
Praise O. Farayola, Ekaniyere Oko-Odion, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
Publikováno v:
IEEE Design & Test. :1-1
Autor:
Abdullah O. Obaidi, Praise O. Farayola, Abalhassan Sheikh, Shravan K. Chaganti, Isaac Bruce, Degang Chen, Srivaths Ravi
Publikováno v:
ITC
Autor:
Shravan K. Chaganti, Praise O. Farayola, Srivaths Ravi, Degang Chen, Abalhassan Sheikh, Isaac Bruce
Publikováno v:
DTIS
Massive multisite testing significantly reduces test cost and immensely increases production throughput by simultaneously screening multiple devices under test (DUTs). However, non-trivial variations in measurement from site to site are inevitable, a
Autor:
Abalhassan Sheikh, Abdullah O. Obaidi, Degang Chen, Praise O. Farayola, Shravan K. Chaganti, Isaac Bruce, Srivaths Ravi
Publikováno v:
ETS
Multisite testing has become a proven method to reduce test time and costs for integrated circuits (IC). However, the technique suffers from site-to-site variations, especially when a large number of test sites are involved. It becomes imperative to