Zobrazeno 1 - 10
of 24
pro vyhledávání: '"Srinivas V. Pietambaram"'
Autor:
Claudiu V. Falub, Srinivas V. Pietambaram, Oguz Yildirim, Mojmír Meduňa, Ondrej Caha, Rachid Hida, Xue Zhao, Jan Ambrosini, Hartmut Rohrmann, Hans J. Hug
Publikováno v:
AIP Advances, Vol 9, Iss 3, Pp 035243-035243-6 (2019)
We have studied the structural and magnetic properties of enhanced-permeability-dielectric FeCo/Al2O3-multilayer thin films deposited on 8"-Si wafers in an industrial magnetron sputtering system. The EPD-multilayers consist of 25 periods of alternati
Externí odkaz:
https://doaj.org/article/d0b957c74a034aabaed4d98dbc792536
Autor:
G. Steiner, Kenneth H. Smith, Mark F. Deherrera, Gregory W. Grynkewich, Srinivas V. Pietambaram, Jijun Sun, Renu W. Dave, J.M. Slaughter, B. Craigo, Johan Åkerman, Saied N. Tehrani
Publikováno v:
IEEE Transactions on Magnetics. 42:1935-1939
We report the first demonstration of a magnetoresistive random access memory (MRAM) circuit incorporating MgO-based magnetic tunnel junction (MTJ) material for higher performance. We compare our results to those of AlOx-based devices, and we discuss
Autor:
Mark A. Durlam, Jijun Sun, Mark F. Deherrera, Renu W. Dave, Gregory W. Grynkewich, Srinivas V. Pietambaram, Johan Åkerman, J.M. Slaughter, Kenneth H. Smith, Bradley N. Engel, Saied N. Tehrani, N. D. Rizzo, Brian R. Butcher, Jason Allen Janesky
Publikováno v:
IEEE Transactions on Magnetics. 41:132-136
A 4-Mb magnetoresistive random access memory (MRAM) with a novel magnetic bit cell and toggle switching mode is presented. The circuit was designed in a five level metal, 0.18-mum complementary metal-oxide-semiconductor process with a bit cell size o
Autor:
Brian R. Butcher, Mark F. Deherrera, Johan Åkerman, Jon M. Slaughter, M. Durlam, Gregory W. Grynkewich, Renu W. Dave, J. J. Sun, Srinivas V. Pietambaram, Bradley N. Engel, N. D. Rizzo, Saied N. Tehrani, Jason Allen Janesky, P. Brown, Kenneth H. Smith
Publikováno v:
Scopus-Elsevier
Magnetoresistive random-access memory (MRAM) is a new memory technology that is nearing commercialization. MRAM integrates a magnetic tunnel junction (MTJ) device with standard silicon-based microelectronics, resulting in a combination of qualities n
Autor:
Jag Sankar, Srinivas V. Pietambaram, Rajiv K. Singh, Jacques Perriere, Valentin Craciun, D. Kumar
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 20:198-201
Colossal magnetoresistive La0.7Ca0.3MnO3 (LCMO) films with improved magnetoresistance properties have been grown at relatively low temperatures using an ultraviolet-assisted pulsed laser deposition technique. In this technique, a low pressure Hg lamp
Publikováno v:
Journal of Applied Physics. 86:3317-3326
In this article we report our studies on the microstructure, magnetoresistance (MR) behavior, and magnetic properties of the La1−x−yCaxMnO3 system in thin-film form. By varying the values of x and y in La1−x−yCaxMnO3, we have synthesized an e
Autor:
Srinivas V. Pietambaram, Stephen J. Pearton, Dhananjay Kumar, Yoon-Bong Hahn, Hyun Cho, K. P. Lee, K. B. Jung, Rajiv K. Singh, P. H. Hogan, Klaus Hermann Dahmen
Publikováno v:
Journal of The Electrochemical Society. 146:2748-2751
Effective pattern transfer into PrBaCaMnO 3 and LaSrMnO 3 has been achieved using Cl 2 /Ar discharges operated under inductively coupled plasma conditions. Etch rates up to 900 A min -1 for LaSrMnO 3 and 300 A min -1 for PrBaCaMnO 3 were obtained, wi
Publikováno v:
Physical Review B. 58:8182-8185
A systematic investigation focused on the magnetoresistance (MR) behavior of ${\mathrm{La}}_{0.7}{\mathrm{Ca}}_{x}{\mathrm{MnO}}_{3}$ ($x=0,$ 0.2, and 0.3) thin films has been carried out. As indicated by the unit chemical formula, ${\mathrm{La}}_{0.
Autor:
Renu W. Dave, J.M. Slaughter, Jijun Sun, Srinivas V. Pietambaram, Jason Allen Janesky, G. Steiner
Publikováno v:
IEEE Transactions on Magnetics. 40:2619-2621
Synthetic antiferromagnet (SAF) structures are a key element of TMR and GMR read heads and MRAM devices. Control of the SAF coupling strength and thermal endurance are key issues for these technologies. We find that the coupling strength increases wi
Autor:
Soma Chattopadhyay, Dhananjay Kumar, Alexander Kvit, Srinivas V. Pietambaram, A. K. Sharma, Jagdish Narayan, Rajiv K. Singh, Jag Sankar, C. B. Lee, Walter M. Gilmore
Publikováno v:
Applied Physics Letters. 78:1098-1100
We report an epitaxial growth of LCMO (La2/3Ca1/3MnO3) film on Si by using a highly conducting diffusion barrier layer of TiN. In order to achieve epitaxial growth of LCMO films, MgO, and SrTiO3 films were used as intermediate layers between LCMO and