Zobrazeno 1 - 10
of 35
pro vyhledávání: '"Srinivas Bodapati"'
Autor:
Anand Koirala, Meena Jha, Girija Chetty, Srinivas Bodapati, Animesh Mishra, Praveen Kishore Sahu, Sanjib Mohanty, Timir Kanta Padhan, Ajat Hukkoo, Jyoti Mattoo
Publikováno v:
Scientific Reports, Vol 14, Iss 1, Pp 1-13 (2024)
Abstract The identification of malaria infection using microscope images of blood smears is considered as a ‘gold standard’. The diagnosis of malaria needs expert microscopists which are scarce in remote areas where malaria is endemic. Therefore,
Externí odkaz:
https://doaj.org/article/a9110426c177408d85f0e798ed1bf1a5
Autor:
Anand Koirala, Meena Jha, Srinivas Bodapati, Animesh Mishra, Girija Chetty, Praveen Kishore Sahu, Sanjib Mohanty, Timir Kanta Padhan, Jyoti Mattoo, Ajat Hukkoo
Publikováno v:
IEEE Access, Vol 10, Pp 102157-102172 (2022)
Malaria in the rural and remote regions of tropical countries remain a major public health challenge. Early diagnosis and prompt effective treatment are the basis for the management of malaria and for reducing malaria mortality and morbidity worldwid
Externí odkaz:
https://doaj.org/article/a78a3727194b464db7ea1e42d60f53f1
Publikováno v:
IEEE Robotics and Automation Letters. 5:1047-1054
Complete blood cell count, which indicates the density of different blood cells in the human body is extremely important for evaluating the overall health of a person and also for detecting a wide range of disorders, including anemia, infection and l
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1e6d4f9fce80c637f4219860e9781e86
https://doi.org/10.1109/lra.2020.2967290
https://doi.org/10.1109/lra.2020.2967290
Hyperspherical Clustering and Sampling for Rare Event Analysis with Multiple Failure Region Coverage
Publikováno v:
ISPD
Statistical circuit simulation is exhibiting increasing importance for circuit design under process variations. It has been widely used throughout the design of standard cell circuits (SRAM, Flip-Flop, etc.) to maximize yield, i.e. to minimize the fa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1e23c6b853c8237e392d5a6ea2b8cba4
https://doi.org/10.1145/2872334.2872360
https://doi.org/10.1145/2872334.2872360
Autor:
Koirala, Anand1 (AUTHOR), Jha, Meena2 (AUTHOR) m.jha@cqu.edu.au, Chetty, Girija3 (AUTHOR), Bodapati, Srinivas4 (AUTHOR), Mishra, Animesh5 (AUTHOR), Sahu, Praveen Kishore6 (AUTHOR), Mohanty, Sanjib6 (AUTHOR), Padhan, Timir Kanta6 (AUTHOR), Hukkoo, Ajat4 (AUTHOR), Mattoo, Jyoti7 (AUTHOR)
Publikováno v:
Scientific Reports. 10/11/2024, Vol. 14 Issue 1, p1-13. 13p.
Autor:
Farid N. Najm, Srinivas Bodapati
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 25:837-855
The authors present a frequency domain current macro-modeling technique for capturing the dependence of the block current waveform on its input vectors. The macro model is based on estimating the discrete cosine transform (DCT) of the current wavefor
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2fa7da1188c4e1bdb708c73ec2a48e01
https://doi.org/10.1109/tcad.2005.855976
https://doi.org/10.1109/tcad.2005.855976
Autor:
Paul A. Packan, S. Mudanai, C. Auth, Chetan Prasad, S. Ramey, Martin D. Giles, Kaizad Mistry, Sanjay Natarajan, Ian R. Post, J. Hicks, S. Gupta, Srinivas Bodapati, K. Kuhn, M. Agostinelli
Publikováno v:
2014 IEEE International Reliability Physics Symposium.
A summary of NBTI variation is reported on large data-sets across five generations of Intel technologies (90 nm to 22 nm) and a comparison of statistical frameworks is utilized to show the universality of variation metrics across generations. Large v
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::28dc29df5384a15805f55823b06d6bb1
https://doi.org/10.1109/irps.2014.6861101
https://doi.org/10.1109/irps.2014.6861101
Autor:
Srinivas Bodapati, Farid N. Najm
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 9:943-958
We present a novel technique for estimating individual wire lengths in a given standard-cell-based design during the technology mapping phase of logic synthesis. The proposed method is based on creating a black box model of the place and route tool a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::174b75c303345633f8332b4ea2fbae03
https://doi.org/10.1109/92.974908
https://doi.org/10.1109/92.974908
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. :1-1
The impact of process variations continues to grow as transistor feature size shrinks. Such variations in transistor parameters lead to variations and unpredictability in circuit output and may ultimately cause them to violate specifications leading
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cf6b4ef284d376f28f0103265243b2fb
https://doi.org/10.1109/tcad.2016.2562923
https://doi.org/10.1109/tcad.2016.2562923
Publikováno v:
CICC
This paper discusses pre- and post-silicon electrical validation requirements for highly integrated designs and highlights the need for large-scale modeling and simulation of analog components in the context of validation. Current fast SPICE tools an
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::28284f73db1f5b0a8505713ad1a27fca
https://doi.org/10.1109/cicc.2012.6330559
https://doi.org/10.1109/cicc.2012.6330559