Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Sreenivaas S. Muthyala"'
Publikováno v:
DFTS
In system-on-chip (SOC) designs, embedded processors are frequently present as part of the functional design and can be used to help test the chip or system by providing a software-based test. Previous work has looked at compacting output responses i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f95d0b412d935a8cc05c4d0a1713bb82
https://doi.org/10.1109/dft.2015.7315154
https://doi.org/10.1109/dft.2015.7315154
Autor:
Sreenivaas S. Muthyala, Nur A. Touba
Publikováno v:
VLSI-SoC: Internet of Things Foundations ISBN: 9783319252780
VLSI-SoC (Selected Papers)
VLSI-SoC (Selected Papers)
Three Dimensional Integrated Circuits are an important new paradigm in which different dies are stacked atop one another, and interconnected by Through Silicon Vias (TSVs). Testing 3D-ICs poses additional challenges because of the need to transfer da
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9198047808327081e9244bf87ec195b1
https://doi.org/10.1007/978-3-319-25279-7_2
https://doi.org/10.1007/978-3-319-25279-7_2
Autor:
Sreenivaas S. Muthyala, Nur A. Touba
Publikováno v:
VLSI-SoC
A highly efficient test compression scheme for 3D-ICs is proposed, which uses sequential linear decompressors local to each core. The compressed test data is brought from the tester over the test access mechanism (TAM) to the cores where they are dec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3a16203f842d1de856f9389e5c710fab
https://doi.org/10.1109/vlsi-soc.2014.7004157
https://doi.org/10.1109/vlsi-soc.2014.7004157
Autor:
Sreenivaas S. Muthyala, Nur A. Touba
Publikováno v:
ITC
Scan feedforward techniques are proposed for improving test compression for both sequential linear decompressors based on solving linear equations and for broadcast scan based decompressors in which the decompressor constraints are included in the au
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a6b6ba36e1a39d9724db6034ddfe1978
https://doi.org/10.1109/test.2014.7035358
https://doi.org/10.1109/test.2014.7035358
Autor:
Sreenivaas S. Muthyala, Nur A. Touba
Publikováno v:
VTS
A highly efficient SOC test compression scheme which uses sequential linear decompressors local to each core is proposed. Test data is stored on the tester in compressed form and brought over the TAM to the core before being decompressed. Very high e
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::29ff84b921c4e2e83f26428d112ef6a4
https://doi.org/10.1109/vts.2013.6548884
https://doi.org/10.1109/vts.2013.6548884
Autor:
Sreenivaas S. Muthyala, Nur A. Touba
Publikováno v:
ITC
Sequential linear decompressors are inherently efficient and attractive for compressing test cubes with many don't cares. The test cubes are encoded by solving a system of linear equations. In continuous decompression, typically a fixed number of fre
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::761f0c157aac550689f60b834ec9f193
https://doi.org/10.1109/test.2012.6401557
https://doi.org/10.1109/test.2012.6401557